LALIC, M.V.MESTNIK FILHO, J.2014-07-152014-07-302014-07-152014-07-302005LALIC, M.V.; MESTNIK FILHO, J. Correlation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latter. <b>Hyperfine Interactions</b>, v. 158, n. 1-4, p. 89-93, 2005. DOI: <a href="https://dx.doi.org/10.1007/s10751-005-9013-7">10.1007/s10751-005-9013-7</a>. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/5529.0304-3843http://repositorio.ipen.br/handle/123456789/552989-93openAccesscadmiumimpuritiescopper oxidesboron oxidessemiconductor materialselectric fieldsdensity functional methodCorrelation between the EFG values measured at the Cd impurity in a group of Cu-based delafossites and the semiconducting properties of the latterArtigo de periódico1-415810.1007/s10751-005-9013-7