SANTOS, L.R.VIVOLO, V.NAVARRO, M.V.T.XAVIER, M.POTIENS, M.P.A.2018-02-262018-02-262017SANTOS, L.R.; VIVOLO, V.; NAVARRO, M.V.T.; XAVIER, M.; POTIENS, M.P.A. Filtration influence in a constant potential X-ray machine peak voltage measurements. <b>Brazilian Journal of Radiation Sciences</b>, v. 05, n. 02, p. 01-09, 2017. Disponível em: http://repositorio.ipen.br/handle/123456789/28570.2319-0612http://repositorio.ipen.br/handle/123456789/28570This work shows the peak voltage measurements for several beam filtrations used in diagnostic radiology, using two types of non-invasive detectors; a voltage meter and a high-resolution spectrometer. The technique chosen for the voltage peak measurements with the spectrometer was the endpoint. The results were compared to the measured ones and showed good similarity to the nominal values. However the voltage meter detector used in this work pre-sented errors for heavier filtrations.01-09openAccessbeamscalibrationelectric potentialpeaksradiologysemiconductor detectorsspectroscopyx-ray dosimetryx-ray sourcesArtigo de periódico0205https://orcid.org/0000-0002-4049-6720Sem Percentil