CORREA, A.A.S.BUENO, C.C.GONCALVES, J.A.C.MENDES, P.F.P.R.PINTO, J.K.C.SOUZA, J.P.SANTOS, M.D.S.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01CORREA, A.A.S.; BUENO, C.C.; GONCALVES, J.A.C.; MENDES, P.F.P.R.; PINTO, J.K.C.; SOUZA, J.P.; SANTOS, M.D.S. Manufactured silicon diode used as an internal conversion electrons detector. In: LATINAMERICAN SYMPOSIUM ON NUCLEAR PHYSICS, 5th; REUNIAO DE TRABALHO SOBRE FISICA NUCLEAR NO BRASIL, 26, Sept. 1-5, 2003, Santos, SP. <b>Abstracts...</b> p. 42. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/21837.http://repositorio.ipen.br/handle/123456789/2183742openAccesselectron detectionbeta detectionsilicon diodescoincidence spectrometryphosphorus 32barium 133energy resolutionManufactured silicon diode used as an internal conversion electrons detectorResumo de eventos cientÃficoshttps://orcid.org/0000-0002-8940-9544https://orcid.org/0000-0001-7881-7254