NASCIMENTO, E. doHELENE, O.VANIN, V.R.CRUZ, M.T.F. daMORALLES, M.2014-07-152014-07-302014-07-152014-07-302009NASCIMENTO, E. do; HELENE, O.; VANIN, V.R.; CRUZ, M.T.F. da; MORALLES, M. Statistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in silicon. <b>Nuclear Instruments and Methods in Physics Research</b>, v. 609, n. 2-3, p. 244-249, 2009. Section A. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/4779.0168-9002http://repositorio.ipen.br/handle/123456789/4779244-249openAccessannihilationbackscatteringdoppler broadeningelectron-positron interactionselectronsleast square fitpositronsradiation detectionresponse functionssiliconsodium 22spectravalenceStatistical analysis of the doppler broadening coincidence spectrum of electron-positron annihilation radiation in siliconArtigo de periódico2-3609Section Ahttps://orcid.org/0000-0002-2664-5531