RAELE, MARCUS P.TARELHO, LUIZ V.G.AZEREDO, CARLOS L. da S.COUCEIRO, IAKYRA B.FREITAS, ANDERSON Z.2015-01-062015-01-062014RAELE, MARCUS P.; TARELHO, LUIZ V.G.; AZEREDO, CARLOS L. da S.; COUCEIRO, IAKYRA B.; FREITAS, ANDERSON Z. Improving axial resolution in spectral domain low-coherence interferometry through fast fourier transform harmonic artifacts. <b>Optical Engineering</b>, v. 53, n. 7, p. 073106-1 - 073106-11, 2014. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/23228.0091-3286http://repositorio.ipen.br/handle/123456789/23228073106-1 - 073106-11closedAccessinterferometryfourier transformationtomographyoptical propertiesimagesaccuracyImproving axial resolution in spectral domain low-coherence interferometry through fast fourier transform harmonic artifactsArtigo de periódico753https://orcid.org/0000-0002-5018-9126https://orcid.org/0000-0002-6461-6766