OLIVA, JEFFERSON W.M.ZAHN, GUILHERME S.GENEZINI, FREDERICO A.VANIN, VITO R.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02OLIVA, JEFFERSON W.M.; ZAHN, GUILHERME S.; GENEZINI, FREDERICO A. Half-life of 52V. In: VANIN, VITO R. (ed.). In: BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd, September 7-11, 2010, Campos do Jordão, SP. <b>Proceedings...</b> p. 137-139. DOI: <a href="https://dx.doi.org/10.1063/1.3608947">10.1063/1.3608947</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/17877.http://repositorio.ipen.br/handle/123456789/17877In this work, the half life of the β decay of 52V was measured by following the activity of 32 samples of 50 μg each after they were irradiated in the IEA-R1 reactor of IPEN-CNEN/SP. The results were then fitted using a non-paralizable dead time correction to the regular exponential decay and the individual half-life values obtained were then analyzed using different statistical methods (Weighted Average, Normalized Residuals and Rajeval Technique), resulting in a value of 3.733(4) min. The obtained result is somewhat smaller than tabulated one but the difference does not surpass two standard deviations.137-139openAccessactivation analysisbeta decaybeta decay radioisotopesbeta particlesdays living radioisotopesdecayhalf-lifelifetimequalitative chemical analysisquantitative chemical analysisradioactivationvanadiumvanadium 52Texto completo de evento10.1063/1.3608947https://orcid.org/0000-0002-6318-6805https://orcid.org/0000-0003-3237-8588