CAVALCANTE, F.H.M.GOMES, M.R.CARBONARI, A.W.PEREIRA, L.F.D.ROSSETTO, D.A.COSTA, M.S.REDONDO, L.M.MESTNIK FILHO, J.SAXENA, R.N.SOARES, J.C.2014-07-152014-07-302014-07-152014-07-302010CAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; REDONDO, L.M.; MESTNIK FILHO, J.; SAXENA, R.N.; SOARES, J.C. Characterization of nanostructured HfOsub(2) films using perturbed angular correlation (PAC) technique. <b>Hyperfine Interactions</b>, v. 198, p. 41-45, 2010. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/4563.0304-3843http://repositorio.ipen.br/handle/123456789/456341-45openAccesshafnium oxidesperturbed angular correlationspectroscopyelectric fieldsthin filmsCharacterization of nanostructured HfOsub(2) films using perturbed angular correlation (PAC) techniqueArtigo de periódico198https://orcid.org/0000-0002-4499-5949