ZEVALLOS CHAVEZ, J.Y.PIRES, C.A.GENEZINI, F.A.ZAHN, G.S.CRUZ, M.T.F.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02ZEVALLOS CHAVEZ, J.Y.; PIRES, C.A.; GENEZINI, F.A.; ZAHN, G.S.; CRUZ, M.T.F. Study of the inactive layer of a germanium detector: experimental and Monte Carlo simulation treatments. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th, ago. 28 - set. 2, 2005, Santos, SP. <b>Anais...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/17666.http://repositorio.ipen.br/handle/123456789/17666openAccesscomparative evaluationse codesefficiencyexperimental datahigh-purity ge detectorsmonte carlo methodsimulationthicknessStudy of the inactive layer of a germanium detector: experimental and Monte Carlo simulation treatmentsTexto completo de eventohttps://orcid.org/0000-0003-3237-8588https://orcid.org/0000-0002-6318-6805