SOUZA, D.N.LIMA, J.F.VALERIO, M.E.G.SASAKI, J.M.CALDAS, L.V.E.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02SOUZA, D.N.; LIMA, J.F.; VALERIO, M.E.G.; SASAKI, J.M.; CALDAS, L.V.E. Radiation-induced charge trapping and recombination process in natural topaz studied by TL, EPR and XRD. In: INTERNATIONAL CONFERENCE ON RADIATION EFFECTS IN INSULATORS, 12th, Aug. 31 - Sept. 5, 2003, Gramado, RS. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/15582.http://repositorio.ipen.br/handle/123456789/15582openAccessmineralsthermoluminescencex-ray diffractometerselectron spin resonancerecombinationRadiation-induced charge trapping and recombination process in natural topaz studied by TL, EPR and XRDTexto completo de eventohttps://orcid.org/0000-0002-7362-2455