ICHIKAWA, R.U.MARTINEZ, L.G.IMAKUMA, K.TURRILLAS, X.GUSATTI, M.RIELLA, H.G.2016-06-232016-06-23ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; TURRILLAS, X.; GUSATTI, M.; RIELLA, H.G. Size-strain x-ray line profile analysis and crystallite size distribution of nanostructured ZnO. In: TALLER DE LA ASSICIACION ARGENTINA DE CRISTALOGRAFIA, 2.; REUNION ANUAL DE LA ASSOCIACION ARGENTINA DE CRYSTALOGRAFIA, 9.; REUNION LATINOAMERICANA DE CRISTALOGRAFIA, 1., 28 de octubre - 1 novembre, 2013, Cordoba, Argentina. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/26413.http://repositorio.ipen.br/handle/123456789/26413openAccesscorrectionsnanostructureszinc oxidesx-ray diffractioncalibration standardssizestrainsdistributionSize-strain x-ray line profile analysis and crystallite size distribution of nanostructured ZnOTexto completo de eventohttps://orcid.org/0000-0003-0435-6082https://orcid.org/0000-0001-7707-7821