COSTA, C.A.B.S.CARDOSO, L.P.MAZZOCCHI, V.L.PARENTE, C.B.R.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02COSTA, C.A.B.S.; CARDOSO, L.P.; MAZZOCCHI, V.L.; PARENTE, C.B.R. Multiple diffraction simulation in the study of epitaxial layers. In: INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORS, Sept. 17-22, 1989, Yokohama, Japan. DOI: <a href="https://dx.doi.org/10.1016/B978-0-444-88429-9.50092-6">10.1016/B978-0-444-88429-9.50092-6</a>. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/14855.http://repositorio.ipen.br/handle/123456789/14855openAccesssemiconductor materialslayersepitaxyx-ray diffractionsimulationMultiple diffraction simulation in the study of epitaxial layersTexto completo de evento10.1016/B978-0-444-88429-9.50092-6