HARAGUCHI, MARCIO I.KIM, HAE Y.CALVO, WILSON A.P.2022-04-052022-04-05HARAGUCHI, MARCIO I.; KIM, HAE Y.; CALVO, WILSON A.P. Process equipment imaging by tomographic gamma scan. In: AIChE ANNUAL MEETING, October 28 - November 2, 2018, Pittsburgh, PA. <b>Apresentação...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/32935.http://repositorio.ipen.br/handle/123456789/32935openAccessimage processingtomographycomputerized tomographyindustrial radiographyradiation detectorsTexto completo de evento0000-0002-4316-8335https://orcid.org/0000-0002-4316-8335