SANTOS, H.O.MONTEIRO, W.A.RODRIGUES, V.A.LIMA, N.B.CALDERON BENAVIDES, H.A.YACAMAN, M.J.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01SANTOS, H.O.; MONTEIRO, W.A.; RODRIGUES, V.A.; LIMA, N.B. Scanning electron microscopy studies of Fe- 3 percent Si texture obtained by etch-pit method. In: CALDERON BENAVIDES, H.A. (ed.); YACAMAN, M.J. (ed.). In: INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY, 14th, Aug. 31 - Sept. 4, 1998, Cancun, Mexico. <b>Proceedings...</b> p. 245-246. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/21813.http://repositorio.ipen.br/handle/123456789/21813245-246openAccesssteelsiron alloyssilicon alloyshot workingtextureetchingscanning electron microscopygrain orientationScanning electron microscopy studies of Fe- 3 percent Si texture obtained by etch-pit methodResumo de eventos cientÃficoshttps://orcid.org/0000-0002-6444-9224