PASCOALINO, KELLY C.S.CAMARGO, FABIO deGONCALVES, JOSEMARY A.C.BUENO, CARMEN C.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02PASCOALINO, KELLY C.S.; CAMARGO, FABIO de; GONCALVES, JOSEMARY A.C.; BUENO, CARMEN C. Influence of the dead-zone thickness on a PIN diode response for alfa spectrometry. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 8th/ MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 15th, Sept. 30 - Oct. 5, 2007, Santos, SP. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/15755.http://repositorio.ipen.br/handle/123456789/15755openAccessalpha detectionalpha spectroscopyamericium 241americiumcurium 244curiumjunction diodesplutonium 239plutoniumInfluence of the dead-zone thickness on a PIN diode response for alfa spectrometryTexto completo de eventohttps://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-9544