CARLOS HENRIQUE DE MESQUITA

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  • Resumo IPEN-doc 15721
    A comparative study on the performance of radiation detectors from the HgI2 crystals grown by different techniques
    2011 - MARTINS, J.F.T.; COSTA, F.E.; SANTOS, R.A.; MESQUITA, C.H.; HAMADA, M.M.
    There have been attempts to develop room-temperature X- and gamma ray semiconductor detectors for various applications. The main physical semiconductor properties required for fabrication of room temperature semiconductor detectors are: (1) high atomic number; (2) high density; (3) high absorption coefficient; (4) a band gap large enough to keep leakage currents low, at room temperature and (5) large electron and hole mobility-lifetime products, for an efficient charge collection [1, 2]. Among these types of detectors, HgI2 has emerged as a particularly interesting material in view of its wide band gap (2.13 eV) and its large density (7.5 g/cm3 ). HgI2 crystals are composed of high atomic number elements (ZHg=80 and Zi=53) and with high resistivity (>1014 ficm). These are important factors in applications where compact and small thickness detectors are necessary for X- and gamma rays measurements. However, the applications of Hgi2 are limited by the difficulty in obtaining high-quality single crystals and the long-term reliability problems in devices made from crystals [1]. in this work, the Hgi2 crystals were grown using four different techniques: (a) physical vapor transport, (b) solution from dimethyl sulfoxide complexes, (c) vapor growth of HgI2 precipitated from acetone and (d) Bridgman method. The obtained crystals for four methods were characterized considering the following physical chemistry properties: crystal stoichiometry, crystal structure, plan of the crystal orientation, surface morphology of the crystal and crystal impurity. The influence of these physical chemistry properties on the crystals developed by four techniques was studied, evaluating their performance as a radiation detector. The best result of radiation response was found for the crystal grown by physical vapor transport. Also, the dependence of the radiation response on the HgI2 crystal purity was also studied. For this, the HgI2 raw material was purified by the many pass zone refining technique. A significant improvement in the characteristics of the detector-crystal was achieved, when the starting materials became purer.
  • Resumo IPEN-doc 15453
    Development of the mechanical system on a third-generation industrial computed tomography scanner in Brazil
    2011 - CALVO, WILSON A.P.; MESQUITA, CARLOS H. de; SPRENGER, FRANCISCO E.; COSTA, FABIO E. da; SALVADOR, PABLO A.V.; CARVALHO, DIEGO V. de S.; HAMADA, MARGARIDA M.
    The development of measurement geometry for medical X-ray computed tomography (CT) scanners carried out from the first to the fourth-generation. This concept has also been applied for imaging of industrial processes such as pipe flows or for improving design, operation, optimization and troubleshooting. Nowadays, gamma CT permits to visualize failure equipment points in three-dimensional analysis and in sections of chemical and petrochemical industries. The aim of this work is the development of the mechanical system on a third-generation industrial CT scanner to analyze laboratory gas absorption column which perform highly efficient separation, turning the 60Co, 137Cs or 192Ir sealed gamma-ray source and the NaI(Tl) multidetector array. It has also a translation movement along the column axis to obtain as many slices of the process flow as needed. The mechanical assembly for this third-generation industrial CT scanner is comprised by strength and rigidity structural frame in stainless and carbon steels, rotating table, source shield and collimator with pneumatic exposure system, spur gear system, translator, rotary stage, drives, and stepper motors. The use of suitable spur gears has given a good repeatability and high accuracy in the degree of veracity. The data acquisition boards, mechanical control interfaces, software for movement control and image reconstruction were specially development. This third-generation industrial CT scanner has obtained good spatial resolution and images. The filtered back projection (FBP) tomographic reconstruction algorithm used has shown a faster convergence. The mechanical system presented a good performance in terms of strength, rigidity, accuracy and repeatability with great potential to be used for education or program dedicated to training chemical and petrochemical industry professionals and for industrial process optimization in Brazil.
  • Artigo IPEN-doc 23044
    Purification and crystal growth of the bismuth (III) iodide-influence of trace impurities on the crystal quality
    2017 - FERRAZ, CAUE de M.; ARMELIN, MARIA J.A.; OLIVEIRA, RENE R.; OTUBO, LARISSA; MARTINS, JOAO F.T.; SANTOS, ROBINSON A. dos; COSTA, FABIO E.; CARVALHO, DIEGO V.S.; OMI, NELSON M.; MESQUITA, C.H.; HAMADA, MARGARIDA M.
    This work describes the experimental procedure of purification and preparation of BiI3 crystals by Repeated Vertical Bridgman technique, aiming a future application of this semiconductor crystal as a room temperature radiation detector. The BiI3 powder used as raw material was purified three times and, at each purification, the crystal was evaluated by systematic measurements of the reduction of the impurities, crystalline structure, stoichiometry and surface morphology. The reduction of the trace metal impurities in the BiI3, at each purification, was analyzed by Instrumental Neutron Activation Analysis (INAA), in order to evaluate the efficiency of the purification technique established in this work. It was demonstrated that the Repeated Bridgman technique is effective to reduce the concentration of many impurities in BiI3, such as Ag, As, Br, Cr, K, Mo, Na and Sb. The crystalline structure of the BiI3 crystal purified twice and three times was similar to BiI3 pattern. However, for BiI3 powder and purified once, an intensity contribution of the BiOI was observed in the diffractograms. Improvement in the stoichiometric ratio was observed at each purification step, as well as the crystal surface morphology.
  • Artigo IPEN-doc 23998
    Influence of impurities on the radiation response of the TlBr semiconductor crystal
    2017 - SANTOS, ROBINSON A. dos; MESQUITA, CARLOS H. de; SILVA, JULIO B.R. da; FERRAZ, CAUE de M.; COSTA, FABIO E. da; MARTINS, JOAO F.T.; GENNARI, ROSELI F.; HAMADA, MARGARIDA M.
    Two commercially available TlBr salts were used as the rawmaterial for crystal growths to be used as radiation detectors. Previously, TlBr salts were purified once, twice, and three times by the repeated Bridgmanmethod. Thepurification efficiency was evaluated by inductively coupled plasma mass spectroscopy (ICP-MS), after each purification process. A compartmental model was proposed to fit the impurity concentration as a function of the repetition number of the Bridgman growths, as well as determine the segregation coefficients of impurities in the crystals. The crystalline structure, the stoichiometry, and the surface morphology of the crystals were evaluated, systematically, for the crystals grown with different purification numbers. To evaluate the crystal as a radiation semiconductor detector, measurements of its resistivity and gamma-ray spectroscopy were carried out, using 241Am and 133Ba sources. A significant improvement of the radiation response was observed in function of the crystal purity.
  • Resumo IPEN-doc 07803
    Estudo de dano da radiacao nos detectores plasticos cintiladores
    1998 - HAMADA, M.M.; RELA, P.R.; COSTA, F.E.; MESQUITA, C.H.
  • Artigo IPEN-doc 19405
    Influence of impurities on the surface morphology of the TlBr crystal semiconductor
    2013 - SANTOS, ROBINSON A. dos; SILVA, JULIO B.R. da; MARTINS, JOAO F.T.; FERRAZ, CAUE de M.; COSTA, FABIO E. da; GENNARI, ROSELI F.; MESQUITA, CARLOS H. de; HAMADA, MARGARIDA M.
  • Artigo IPEN-doc 17358
    Development of a fourth generation industrial tomography for multiphase systems analysis
    2010 - MESQUITA, C.H.; DANTAS, C.R.; COSTA, F.E.; CARVALHO, D.V.S.; MADI FILHO, T.; VASQUEZ, P.A.S.; HAMADA, M.M.
  • Artigo IPEN-doc 17188
    Multielementar segregation analysis of the thallium bromide impurities purified by repeated bridgman technique
    2011 - SANTOS, ROBINSON A. dos; COSTA, FABIO E. da; GENNARI, ROSELI F.; MARTINS, JOAO F.T.; MARCONDES, RENATA M.; MESQUITA, CARLOS H. de; HAMADA, MARGARIDA M.
  • Artigo IPEN-doc 07264
    Desenvolvimento de detector-contador para fins de ensino em instrumentacao nuclear
    2000 - COSTA, F.E.; HAMADA, M.M.; PEREIRA, M.C.C.; MESQUITA, C.H.
  • Artigo IPEN-doc 06903
    Radiation damage studies on the optical and mechanical properties of plastic scintillators
    1998 - HAMADA, M.M.; RELA, P.R.; COSTA, F.E.; MESQUITA, C.H.