Xabier Mikel Turrillas Maisterra
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Artigo IPEN-doc 27416 Thickness estimation of TiO2-based nanotubes using X-ray diffraction techniques2020 - FARIA, MARCELA E.M.; LEITE, MARINA M.; ICHIKAWA, RODRIGO U.; VICHI, FLAVIO M.; TURRILLAS, X.; MARTINEZ, L.G.TiO2-based nanotubes are a very promising material with many applications in solar cells, biomedical devices, gas sensors, hydrogen generation, supercapacitors, and lithium batteries, among others. Nanotube thickness is a very important property since it is related to electronic and surface mechanics. In this sense, transmission electron microscopy (TEM) can be used. However, it can be difficult to acquire a good TEM image because the transversal section of the nanotubes needs to be visible. In this work, TiO2-based nanotubes obtained via hydrothermal synthesis were studied using X-ray line profile analysis. Scherrer and Single-Line methods provided consistent results for the thickness of the nanotubes (≃ 5 nm) when compared with TEM. Additionally, Single-Line method was also applied to estimate the microstrain. The advantage of using XRD is given by the fact that it is a quick and statistically significant analysis when compared with TEM. The results show that XRD can be used as a rapid and reliable alternative for the thickness estimation of nanotubes.Artigo IPEN-doc 22319 Size-strain x-ray line profile analysis and crystallite size distribution of nanostructured ZnO2013 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; TURRILLAS, X.; GUSATTI, M.; RIELLA, H.G.Resumo IPEN-doc 21597 Portland cement paste behaviour under gamma radiation field in geological repository2015 - FERREIRA, E.G.A.; VICENTE, R.; TURRILLAS, X.; VOKAICHIYA, F.; FRANCO, M.; MARTINEZ, L.G.; MARUMO, J.T.Artigo IPEN-doc 20764 Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis2014 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; LINHARES, H.M.S.M.D.; RANIERI, I.M.; TURRILLAS, X.Artigo IPEN-doc 20628 Development of a methodology for the application of the Warren-Averbach method2014 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; TURRILLAS, X.