Xabier Mikel Turrillas Maisterra
4 resultados
Resultados de Busca
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Resumo IPEN-doc 22331 Study of the microstructure in remelted zircaloy by synchrotron diffraction line profile analysis2014 - ICHIKAWA, RODRIGO U.; MARTINEZ, LUIS G.; PEREIRA, LUIZ A.T.; IMAKUMA, KENGO; TURRILLAS, XABIERArtigo IPEN-doc 22319 Size-strain x-ray line profile analysis and crystallite size distribution of nanostructured ZnO2013 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; TURRILLAS, X.; GUSATTI, M.; RIELLA, H.G.Artigo IPEN-doc 20764 Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis2014 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; LINHARES, H.M.S.M.D.; RANIERI, I.M.; TURRILLAS, X.Artigo IPEN-doc 20628 Development of a methodology for the application of the Warren-Averbach method2014 - ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; TURRILLAS, X.