Xabier Mikel Turrillas Maisterra
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Resumo IPEN-doc 20631 Estimation of mean crystallite sizes of XRD standard reference materials produced at IPEN by XLPA2014 - MARTINEZ, LUIS G.; ICHIKAWA, RODRIGO U.; IMAKUMA, KENGO; TURRILLAS, XABIER; ORLANDO, MARCOS T.D.Resumo IPEN-doc 17974 Development of standard reference materials for powder diffraction2011 - MARTINEZ, L.G.; GALVAO, A.S.A.; ROSSI, J.L.; ORLANDO, M.T.D.; TURRILLAS, X.; CORREA, H.P.S.