2005 - PUGLIESI, R.; ANDRADE, M.L.G.; PEREIRA, M.A.S.; PUGLIESI, F.
In the present work, a new radiographic methodology which makes use of conventional X-ray films and low-energy
electrons as penetrating radiation, to inspect low-thickness samples, has been investigated. The radiographic
characteristics for the ‘‘electron beam–film’’ set, regarding its sensitivity to discern thickness changes of materials, as
well as the spatial resolution achieved in the image have been determined. Some radiographs are presented and
demonstrate the method’s potential to inspect thin samples.