GUILHERME SOARES ZAHN

Resumo

Has a bachelor's degree in Physics from Universidade de São Paulo (1991), master's at Nuclear Engineering from Universidade de São Paulo (1994) and doctorate at Nuclear Engineering from Universidade de São Paulo (2006). Has experience in nuclear ans applied physics, focusing on nuclear structure, acting on the following subjects: beta decay, neutron activation, gamma spectroscopy, nuclear structure, neutron flux determination and detection, and also on the development od instrumentation and sotware aimed at nuclear applications. (Text obtained from the Currículo Lattes on October 14th 2021)


Possui graduação em Física pela Universidade de São Paulo (1991), mestrado em Tecnologia Nuclear pela Universidade de São Paulo (1994) e doutorado em Tecnologia Nuclear pela Universidade de São Paulo (2006). Atualmente é pesquisador da Comissão Nacional de Energia Nuclear, lotado no Centro do Reator de Pesquisas do Instituto de Pesquisas Energéticas e Nucleares. Tem experiência na área de Física Nuclear, com ênfase em Estrutura Nuclear, atuando principalmente nos seguintes temas: decaimento beta, detecção de nêutrons, irradiadores de nêutrons, ativação neutrônica, fluxo de nêutrons, desenvolvimento de instrumentação e de software para aplicações nucleares. (Texto extraído do Currículo Lattes em 14 out. 2021)

Projetos de Pesquisa
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Resultados de Busca

Agora exibindo 1 - 3 de 3
  • Artigo IPEN-doc 25903
    AnalisaCAEN, a simple software suite to reduce and analyze coincidence data collected using CAEN v1724 digitizer
    2019 - ZAHN, G.S.; GENEZINI, F.A.; RIBEIRO JUNIOR, I.
    In this work a small software suite for the reduction and analysis of coincidence data collected using CAEN’s proprietary software was developed. These software check the output files for coincidences, generate a single list mode file with the coincident events, build histograms for each input, plus a time difference histogram and a 2-detector data matrix, perform time gates and allows for the subtraction of accidental coincidences, and perform energy gating on the final data matrices, generating histograms with the gated spectra. Moreover, the suite has an integrator that guides the user through all the required steps.
  • Artigo IPEN-doc 25902
    A proposal to study long-lived isotopes produced by thermal neutron irradiation of digital devices
    2019 - ZAHN, G.S.; GENEZINI, F.A.; MORALLES, M.; SIQUEIRA, P.T.D.; MEDINA, N.H.; AGUIAR, V.A.P.; MACCHIONE, E.L.A.; ADDED, N.; SILVEIRA, M.A.G. da
    In this work, we present a facility to study errors in digital devices exposed to thermal neutrons from a beam hole in the IEA-R1 nuclear reactor, as well as the long-lived isotopes produced in the irradiation of digital electronic devices under a slow neutron field. Preliminary results obtained with the analysis of a 28nm SRAM-based Xilinx Zynq-7000 FPGA are presented.
  • Artigo IPEN-doc 26528
    Thermal neutron induced upsets in 28nm SRAM
    2019 - AGUIAR, V.A.P.; MEDINA, N.H.; ADDED, N.; MACCHIONE, E.L.A.; ALBERTON, S.G.; RODRIGUES, C.L.; SILVA, T.F.; ZAHN, G.S.; GENEZINI, F.A.; MORALLES, M.; BENEVENUTI, F.; GUAZZELLI, M.A.
    In this work, we present the rst results of static tests in a 28nm SRAM under thermal neutron irradiation from the IPEN/IEA-R1 research reactor. The SRAM used was the con guration memory of a Xilinx Zynq-7000 FPGA and the ECC frame was used to detect bit- ips. It was obtained a SEU cross-section of 9:2(21) 10􀀀16 cm2=bit, corresponding to a FIT/Mb of 12(5), in accordance with expected results. The most probable cause of SEU in this device are 10B contamination on tungsten contacts.