The use of SEM-EDX for the identification of uranium compounds in swipe samples for nuclear safeguards
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2017
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60 YEARS OF IEA-R1: INTERNATIONAL WORKSHOP ON UTILIZATION OF RESEARCH REACTORS
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Resumo
Environmental swipe sampling for safeguards purposes has been used by International
Atomic Energy Agency since 1996 and is a powerful tool to detect undeclared
materials and activities in States under safeguards agreements. The Secondary Electron
Microscope with Energy-Dispersive X-Ray analyzing system (SEM-EDX) can be
particularly useful in the initial identification of uranium in swipe samples and might
be appropriate to identify and characterize uranium particles This work describes the
use of SEM-EDX, as an initial screening technique, in real-life swipe samples for
identifying and characterizing uranium particles. The swipe samples were collected
in a conversion plant at the Nuclear and Energy Research Institute – IPEN/CNEN,
São Paulo, Brazil
Como referenciar
SARKIS, J.E.S.; PESTANA, R.C.B.; MARIN, R.C.; CARVALHO, E.F.U. The use of SEM-EDX for the identification of uranium compounds in swipe samples for nuclear safeguards. In: 60 YEARS OF IEA-R1: INTERNATIONAL WORKSHOP ON UTILIZATION OF RESEARCH REACTORS, November 28 - December 01, 2017, São Paulo, SP. Abstract... São Paulo, SP: Instituto de Pesquisas Energéticas e Nucleares, 2017. p. 73-73. Disponível em: http://repositorio.ipen.br/handle/123456789/28774. Acesso em: 11 May 2024.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.