Test and evaluation of semiconductor components in mixed field radiation monitoring
dc.contributor.author | CARDENAS, JOSE P.N. | pt_BR |
dc.contributor.author | MADI FILHO, TUFIC | pt_BR |
dc.contributor.author | RODRIGUES, LETICIA L.C. | pt_BR |
dc.coverage | Internacional | pt_BR |
dc.creator.evento | INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st | pt_BR |
dc.date.accessioned | 2014-11-17T17:05:35Z | pt_BR |
dc.date.accessioned | 2014-11-18T19:27:16Z | pt_BR |
dc.date.accessioned | 2015-04-02T00:50:20Z | |
dc.date.available | 2014-11-17T17:05:35Z | pt_BR |
dc.date.available | 2014-11-18T19:27:16Z | pt_BR |
dc.date.available | 2015-04-02T00:50:20Z | |
dc.date.evento | September 27 - October 2, 2009 | pt_BR |
dc.event.sigla | INAC; ENAN; ENFIR; ENIN | pt_BR |
dc.identifier.citation | CARDENAS, JOSE P.N.; MADI FILHO, TUFIC; RODRIGUES, LETICIA L.C. Test and evaluation of semiconductor components in mixed field radiation monitoring. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st, September 27 - October 2, 2009, Rio de Janeiro, RJ. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/12015. | |
dc.identifier.orcid | https://orcid.org/0000-0001-7137-0613 | |
dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/12015 | pt_BR |
dc.local.evento | Rio de Janeiro, RJ | pt_BR |
dc.publisher | Sao Paulo: ABEN, 2009 | pt_BR |
dc.rights | openAccess | pt_BR |
dc.subject | experimental data | pt_BR |
dc.subject | iear-1 reactor | pt_BR |
dc.subject | ionizing radiations | pt_BR |
dc.subject | ipen-mb-1 reactor | pt_BR |
dc.subject | neutron converters | pt_BR |
dc.subject | neutron detection | pt_BR |
dc.subject | neutron radiography | pt_BR |
dc.subject | neutron sources | pt_BR |
dc.subject | performance | pt_BR |
dc.subject | photodiodes | pt_BR |
dc.subject | radiation monitoring | pt_BR |
dc.subject | surface barrier detectors | pt_BR |
dc.title | Test and evaluation of semiconductor components in mixed field radiation monitoring | pt_BR |
dc.type | Texto completo de evento | pt_BR |
dspace.entity.type | Publication | |
ipen.autor | LETICIA LUCENTE CAMPOS RODRIGUES | |
ipen.autor | TUFIC MADI FILHO | |
ipen.autor | JOSE PATRICIO NAHUEL CARDENAS | |
ipen.codigoautor | 1195 | |
ipen.codigoautor | 1231 | |
ipen.codigoautor | 1328 | |
ipen.contributor.ipenauthor | LETICIA LUCENTE CAMPOS RODRIGUES | |
ipen.contributor.ipenauthor | TUFIC MADI FILHO | |
ipen.contributor.ipenauthor | JOSE PATRICIO NAHUEL CARDENAS | |
ipen.date.recebimento | 09-10 | pt_BR |
ipen.event.datapadronizada | 2009 | pt_BR |
ipen.identifier.ipendoc | 15005 | pt_BR |
ipen.notas.internas | Proceedings | pt_BR |
ipen.type.genre | Artigo | |
relation.isAuthorOfPublication | d4d34119-a6e6-4026-9a67-7b16d8b668da | |
relation.isAuthorOfPublication | c6d485fe-9927-427a-93a0-0104d2bf801e | |
relation.isAuthorOfPublication | cc496bda-6ca9-4c17-b940-e58b2ef867c2 | |
relation.isAuthorOfPublication.latestForDiscovery | cc496bda-6ca9-4c17-b940-e58b2ef867c2 | |
sigepi.autor.atividade | CARDENAS, JOSE P.N.:1328:330:S | pt_BR |
sigepi.autor.atividade | MADI FILHO, TUFIC:1231:420:N | pt_BR |
sigepi.autor.atividade | RODRIGUES, LETICIA L.C.:1195:330:N | pt_BR |
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