Voltage-composition profile and synchrotron X-ray structural analysis of low and high temperature Lisub(x)CoOsub(2) host material
Carregando...
Data
2008
Data de publicação:
Autores IPEN
Orientador
Título da Revista
ISSN da Revista
Título do Volume
É parte de
É parte de
É parte de
Journal of Physical Chemistry, C
Exportar
Resumo
In the present work, the intercalation of lithium ions in the LixCoO2 host material was investigated by means
of the discharge curves and voltage-composition profile with the main goal of establishing a close correlation
between the voltage-composition patterns and the structure of the LixCoO2 prepared at low and high
temperatures. As a result, the structures of the LixCoO2 prepared at low and high temperatures were investigated
by a careful analysis of synchrotron X-ray powder diffraction (including a quantitative Rietveld refinement),
which showed the presence of two majority phases for LixCoO2 prepared at low temperature, that is, spinel
and layered phases. On the basis of the information provided by the quantitative structural analysis, the voltagecomposition profiles were interpreted by considering at least two ionic modes of charges, one in which lithium
ions occupy sites in the spinel structure and the other in which lithium ions occupy the sites of the layered
structure. It was found that at least two modes (two types of site to charged) of charge were related to the
layered structure during ionic charging of the host. Finally, and curiously, it was found that the decreasing of
the charge capacity as a function of charge-discharge cycles is mainly related to a type of site located in the
layered structure (or sites related to layered phase transition, i.e. order-disorder transition from hexagonal to
monoclinic symmetry).
Como referenciar
BUENO, PAULO R.; PESQUERO, NAIRA C.; FERREIRA, FÁBIO F.; SANTIAGO, ELISABETE I.; VARELA, JOSÉ A.; LONGO, ELSON. Voltage-composition profile and synchrotron X-ray structural analysis of low and high temperature Lisub(x)CoOsub(2) host material. Journal of Physical Chemistry, C, v. 112, n. 37, p. 14655-14664, 2008. DOI: 10.1021/jp803719e. Disponível em: http://repositorio.ipen.br/handle/123456789/4984. Acesso em: 05 Jun 2024.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.