Characterization of tellurium dioxide thin films obtained through the Pechini method

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dc.contributor.authorBATALIOTTI, MURILO D.pt_BR
dc.contributor.authorCOSTA, FRANCINE B.pt_BR
dc.contributor.authorMINUSSI, FERNANDO B.pt_BR
dc.contributor.authorARAUJO, EUDES B.pt_BR
dc.contributor.authorLIMA, NELSON B. dept_BR
dc.contributor.authorMORAES, JOAO C.S.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2022-08-17T18:10:48Z
dc.date.available2022-08-17T18:10:48Z
dc.date.issued2022pt_BR
dc.description.abstractTellurium dioxide (TeO2) thin films were deposited on silicon substrates through the Pechini method, after which they were heat treated at different temperatures. The heat treatment temperatures were defined from the thermogravimetry-differential scanning calorimetry (TG-DSC) data of the precursor gel. The effects of the heat treatment on the structural properties were investigated through X-ray diffraction (XRD), atomic force microscopy, and Raman spectroscopy. The TG-DSC data showed four different weight loss steps due to the reduction of telluric acid to tellurium, the removal of the excess ethylene glycol, the decomposition of citric acid, and the degradation of polyester. The XRD and Raman data showed the presence of the γ- and α-TeO2 phases in the films treated at 400–500 °C. Lattice parameters of the observed crystalline phases were determined by Rietveld refinement, with which it was possible to evaluate the crystallite size and microstrain using the Williamson-Hall method. The heat treatment temperature directly influenced the crystallite size and the surface roughness of the films, which showed similar behaviors with the temperature.pt_BR
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipIDCAPES: 001pt_BR
dc.description.sponsorshipIDCNPq: 307869/2015-6pt_BR
dc.description.sponsorshipIDFAPESP: 17/13769-1pt_BR
dc.format.extent378-385pt_BR
dc.identifier.citationBATALIOTTI, MURILO D.; COSTA, FRANCINE B.; MINUSSI, FERNANDO B.; ARAUJO, EUDES B.; LIMA, NELSON B. de; MORAES, JOAO C.S. Characterization of tellurium dioxide thin films obtained through the Pechini method. <b>Journal of Sol-Gel Science and Technology</b>, v. 103, n. 2, p. 378-385, 2022. DOI: <a href="https://dx.doi.org/10.1007/s10971-022-05844-7">10.1007/s10971-022-05844-7</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/33228.
dc.identifier.doi10.1007/s10971-022-05844-7pt_BR
dc.identifier.fasciculo2pt_BR
dc.identifier.issn0928-0707pt_BR
dc.identifier.orcid0000-0002-6444-9224pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-6444-9224
dc.identifier.percentilfi76.8pt_BR
dc.identifier.percentilfiCiteScore56.5pt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/33228
dc.identifier.vol103pt_BR
dc.relation.ispartofJournal of Sol-Gel Science and Technologypt_BR
dc.rightsopenAccesspt_BR
dc.subjecttellurium oxides
dc.subjectsol-gel process
dc.subjectcrystallization
dc.subjectgrain refinement
dc.subjectthin films
dc.subjectx-ray diffraction
dc.titleCharacterization of tellurium dioxide thin films obtained through the Pechini methodpt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorNELSON BATISTA DE LIMA
ipen.codigoautor550
ipen.contributor.ipenauthorNELSON BATISTA DE LIMA
ipen.date.recebimento22-08
ipen.identifier.fi2.5pt_BR
ipen.identifier.fiCiteScore4.4pt_BR
ipen.identifier.ipendoc28884pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi75.00 - 100.00
ipen.type.genreArtigo
relation.isAuthorOfPublication92984f2d-b6bd-4cd9-950a-e1105bf78d83
relation.isAuthorOfPublication.latestForDiscovery92984f2d-b6bd-4cd9-950a-e1105bf78d83
sigepi.autor.atividadeLIMA, NELSON B. de:550:711:Npt_BR
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