Focus tracking system for femtosecond laser machining using low coherence interferometry

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dc.contributor.authorRAELE, MARCUS P.pt_BR
dc.contributor.authorDE PRETTO, LUCAS R.pt_BR
dc.contributor.authorROSSI, WAGNER dept_BR
dc.contributor.authorVIEIRA JUNIOR, NILSON D.pt_BR
dc.contributor.authorSAMAD, RICARDO E.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2019-07-31T13:43:27Z
dc.date.available2019-07-31T13:43:27Z
dc.date.issued2019pt_BR
dc.description.abstractWe designed a real time, single-laser focus tracking system using low coherence properties of the machining femtosecond laser itself in order to monitor and correct the sample position relative to the focal plane. Using a Michelson Interferometer, the system collects data arising from part of the beam backscattered at the ablation spot. The data is analyzed by a custom software for position correction (employing an XYZ automated translation stage). With the focus tracking enabled we were able to etch channels with a stable cross-section profile on a bovine tooth with relief amplitude tens of times greater than the Rayleigh length of the system, keeping the sample inside the confocal parameter during most of the processing time. Moreover, the system is also capable of monitoring crater depth evolution during the ablation process, allowing for material removal assessment.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDFAPESP: 15/24878-0; 15/15775-3pt_BR
dc.description.sponsorshipIDCNPq: 573916/2008-0; INCT 465763/2014-6pt_BR
dc.format.extent1-8pt_BR
dc.identifier.citationRAELE, MARCUS P.; DE PRETTO, LUCAS R.; ROSSI, WAGNER de; VIEIRA JUNIOR, NILSON D.; SAMAD, RICARDO E. Focus tracking system for femtosecond laser machining using low coherence interferometry. <b>Scientific Reports</b>, v. 9, p. 1-8, 2019. DOI: <a href="https://dx.doi.org/10.1038/s41598-019-40749-6">10.1038/s41598-019-40749-6</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/29988.
dc.identifier.doi10.1038/s41598-019-40749-6pt_BR
dc.identifier.issn2045-2322pt_BR
dc.identifier.orcid0000-0001-7762-8961pt_BR
dc.identifier.orcid0000-0003-0092-9357pt_BR
dc.identifier.orcid0000-0003-1371-7521pt_BR
dc.identifier.orcid0000-0002-6461-6766pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0003-1371-7521
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.percentilfi76.761pt_BR
dc.identifier.percentilfiCiteScore93.00
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/29988
dc.identifier.vol9pt_BR
dc.relation.ispartofScientific Reportspt_BR
dc.rightsopenAccesspt_BR
dc.subjectinterferometry
dc.subjectlaser radiation
dc.subjectmichelson interferometer
dc.subjectlaser beam machining
dc.subjectablation
dc.subjectoptical systems
dc.titleFocus tracking system for femtosecond laser machining using low coherence interferometrypt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorRICARDO ELGUL SAMAD
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorWAGNER DE ROSSI
ipen.autorLUCAS RAMOS DE PRETTO
ipen.autorMARCUS PAULO RAELE
ipen.codigoautor909
ipen.codigoautor1582
ipen.codigoautor73
ipen.codigoautor11268
ipen.codigoautor3272
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorWAGNER DE ROSSI
ipen.contributor.ipenauthorLUCAS RAMOS DE PRETTO
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.date.recebimento19-07
ipen.identifier.fi3.998pt_BR
ipen.identifier.fiCiteScore7.2
ipen.identifier.ipendoc25775pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi3.000 - 4.499
ipen.range.percentilfi75.00 - 100.00
ipen.type.genreArtigo
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sigepi.autor.atividadeSAMAD, RICARDO E.:909:930:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeROSSI, WAGNER de:73:920:Npt_BR
sigepi.autor.atividadeDE PRETTO, LUCAS R.:11268:920:Npt_BR
sigepi.autor.atividadeRAELE, MARCUS P.:3272:910:Spt_BR
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