Filtration influence in a constant potential X-ray machine peak voltage measurements

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dc.contributor.authorSANTOS, L.R.
dc.contributor.authorVIVOLO, V.
dc.contributor.authorNAVARRO, M.V.T.
dc.contributor.authorXAVIER, M.
dc.contributor.authorPOTIENS, M.P.A.
dc.coverageNacionalpt_BR
dc.date.accessioned2018-02-26T13:38:40Z
dc.date.available2018-02-26T13:38:40Z
dc.date.issued2017pt_BR
dc.description.abstractThis work shows the peak voltage measurements for several beam filtrations used in diagnostic radiology, using two types of non-invasive detectors; a voltage meter and a high-resolution spectrometer. The technique chosen for the voltage peak measurements with the spectrometer was the endpoint. The results were compared to the measured ones and showed good similarity to the nominal values. However the voltage meter detector used in this work pre-sented errors for heavier filtrations.pt_BR
dc.format.extent01-09pt_BR
dc.identifier.citationSANTOS, L.R.; VIVOLO, V.; NAVARRO, M.V.T.; XAVIER, M.; POTIENS, M.P.A. Filtration influence in a constant potential X-ray machine peak voltage measurements. <b>Brazilian Journal of Radiation Sciences</b>, v. 05, n. 02, p. 01-09, 2017. Disponível em: http://repositorio.ipen.br/handle/123456789/28570.
dc.identifier.fasciculo02pt_BR
dc.identifier.issn2319-0612pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-4049-6720
dc.identifier.percentilfiSem Percentilen
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/28570
dc.identifier.vol05pt_BR
dc.relation.ispartofBrazilian Journal of Radiation Sciencespt_BR
dc.rightsopenAccesspt_BR
dc.subjectbeams
dc.subjectcalibration
dc.subjectelectric potential
dc.subjectpeaks
dc.subjectradiology
dc.subjectsemiconductor detectors
dc.subjectspectroscopy
dc.subjectx-ray dosimetry
dc.subjectx-ray sources
dc.titleFiltration influence in a constant potential X-ray machine peak voltage measurementspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorMARCOS XAVIER
ipen.autorMARIA DA PENHA ALBUQUERQUE POTIENS
ipen.autorVITOR VIVOLO
ipen.autorLUCAS RODRIGUES DOS SANTOS
ipen.codigoautor712
ipen.codigoautor346
ipen.codigoautor406
ipen.codigoautor8725
ipen.contributor.ipenauthorMARCOS XAVIER
ipen.contributor.ipenauthorMARIA DA PENHA ALBUQUERQUE POTIENS
ipen.contributor.ipenauthorVITOR VIVOLO
ipen.contributor.ipenauthorLUCAS RODRIGUES DOS SANTOS
ipen.date.recebimento18-02pt_BR
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc24418pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationd0233a99-c67a-41f8-9d92-cbce7c44a54e
relation.isAuthorOfPublication30f213ae-321d-4d51-8763-0a2585255fb9
relation.isAuthorOfPublication6875184b-48f2-43e7-b6de-e676ee5db15a
relation.isAuthorOfPublicationc7dbb34c-9e7b-4d45-bffd-57381fc9c260
relation.isAuthorOfPublication.latestForDiscoveryc7dbb34c-9e7b-4d45-bffd-57381fc9c260
sigepi.autor.atividadeSANTOS, L.R.:8725:330:Spt_BR
sigepi.autor.atividadeVIVOLO, V.:406:330:Npt_BR
sigepi.autor.atividadeXAVIER, M.:712:330:Npt_BR
sigepi.autor.atividadePOTIENS, M.P.A.:346:330:Npt_BR
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