Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system

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dc.contributor.authorRAELE, MARCUS P.
dc.contributor.authorSAMAD, RICARDO E.
dc.contributor.authorFREITAS, ANDERSON Z.
dc.contributor.authorPRETTO, LUCAS de
dc.contributor.authorAMARAL, MARCELLO M.
dc.contributor.authorVIEIRA JUNIOR, NILSON D.
dc.contributor.authorWETTER, NIKLAUS U.
dc.contributor.editorKAIERLE, STEFAN
dc.contributor.editorHEINEMANN, STEFAN W.
dc.coverageInternacionalpt_BR
dc.creator.eventoHIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7thpt_BR
dc.date.accessioned2018-09-17T17:13:22Z
dc.date.available2018-09-17T17:13:22Z
dc.date.eventoJanuary 27 - February 01, 2018pt_BR
dc.description.abstractThe backscattered light originated when machining with femtosecond laser pulses can be used to accurately measure the processed surface position through an interferometer, as recently demonstrated by our group, in a setup that uses the same laser beam for ablation and inspection. The present work explores the characteristics of the laser light reflected by the target and its interaction with the resulting plasma to better understand its propagation physics and to improve the dynamic focusing system. The origin of this returning radiation was studied and has been traced, mainly, from the peripheral area of the focal spot (doughnut-like). By means of a Mach-Zehnder setup, the interferometric pattern was measured and analyzed aiming to access the influences of the plasma on the laser beam properties, and therefore on the retrieved information. Finally, the wavefront of the laser that creates and propagates through the plasma was characterized using a Shack-Hartmann sensor.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDFAPESP: 15/24878-0; 13/26113-6pt_BR
dc.description.sponsorshipIDCNPq: 573916/2008-0; 465763/2014-6pt_BR
dc.event.siglaSPIEpt_BR
dc.format.extent105250H-1 - 105250H-9pt_BR
dc.identifier.citationRAELE, MARCUS P.; SAMAD, RICARDO E.; FREITAS, ANDERSON Z.; PRETTO, LUCAS de; AMARAL, MARCELLO M.; VIEIRA JUNIOR, NILSON D.; WETTER, NIKLAUS U. Backscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing system. In: KAIERLE, STEFAN (ed.); HEINEMANN, STEFAN W. (ed.). In: HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th, January 27 - February 01, 2018, San Francisco, California, USA. <b>Proceedings...</b> Bellingham, WA, USA: Society of Photo-optical Instrumentation Engineers, 2018. p. 105250H-1 - 105250H-9. (SPIE Proceedings Series, 10525). DOI: <a href="https://dx.doi.org/10.1117/12.2285899">10.1117/12.2285899</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/29155.
dc.identifier.doi10.1117/12.2285899pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-9379-9530
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0002-5018-9126
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/29155
dc.localBellingham, WA, USApt_BR
dc.local.eventoSan Francisco, California, USApt_BR
dc.publisherSociety of Photo-optical Instrumentation Engineerspt_BR
dc.relation.ispartofseriesSPIE Proceedings Series, 10525pt_BR
dc.rightsopenAccesspt_BR
dc.subjectinterferometry
dc.subjectlasers
dc.subjectablation
dc.subjectplasma
dc.subjectbackscattering
dc.subjectsensors
dc.subjectmeasuring instruments
dc.subjectlaser beam machining
dc.subjectwavelengths
dc.titleBackscattered light properties during femtosecond laser ablation and development of a dynamic interferometric focusing systempt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorLUCAS RAMOS DE PRETTO
ipen.autorNIKLAUS URSUS WETTER
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorANDERSON ZANARDI DE FREITAS
ipen.autorRICARDO ELGUL SAMAD
ipen.autorMARCUS PAULO RAELE
ipen.codigoautor11268
ipen.codigoautor919
ipen.codigoautor1582
ipen.codigoautor880
ipen.codigoautor909
ipen.codigoautor3272
ipen.contributor.ipenauthorLUCAS RAMOS DE PRETTO
ipen.contributor.ipenauthorNIKLAUS URSUS WETTER
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorANDERSON ZANARDI DE FREITAS
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.date.recebimento18-09pt_BR
ipen.event.datapadronizada2018pt_BR
ipen.identifier.ipendoc24968pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
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relation.isAuthorOfPublicationd6670c99-6533-4da0-b054-4a459258a12f
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sigepi.autor.atividadeRAELE, MARCUS P.:3272:910:Spt_BR
sigepi.autor.atividadeSAMAD, RICARDO E.:909:930:Npt_BR
sigepi.autor.atividadeFREITAS, ANDERSON Z.:880:920:Npt_BR
sigepi.autor.atividadePRETTO, LUCAS DE:11268:920:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeWETTER, NIKLAUS U.:919:910:Npt_BR
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