Femtosecond pulsed laser deposition of a boron thin film aiming at the development of a low-cost neutron detector

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dc.contributor.authorCOSTA, PRISCILA
dc.contributor.authorRAELE, MARCUS P.
dc.contributor.authorSAMAD, RICARDO E.
dc.contributor.authorMACHADO, NOE G.P.
dc.contributor.authorVIEIRA JUNIOR, NILSON D.
dc.contributor.authorGENEZINI, FREDERICO A.
dc.contributor.editorKAIERLE, STEFAN
dc.contributor.editorHEINEMANN, STEFAN W.
dc.coverageInternacionalpt_BR
dc.creator.eventoHIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7thpt_BR
dc.date.accessioned2018-08-08T12:22:15Z
dc.date.available2018-08-08T12:22:15Z
dc.date.eventoJanuary 27 - February 01, 2018pt_BR
dc.description.abstractBoron thin films were produced using femtosecond pulsed laser deposition aiming at the development of a neutron detector. As neutrons have no charge, in order to detect this particle converter materials are applied, promoting nuclear reactions that result in the emission of charged particles, allowing the neutrons presence to be indirectly inferred. Among the possible conversion materials, 10B has a considerable cross section for thermal neutrons and accessible cost. Furthermore, the nuclear reaction produces easily detectable alpha particles, making it a rational option to develop a low cost and portable neutron detector. The boron ablation threshold fluence has been measured by the Diagonal Scan (Dscan) technique that resulted in the minimum laser energy value of 17.7 (6) μJ and fluence of 5.63(19) J/cm2. Boron deposition was performed varying the pulse energy and deposition duration. The growth rate, morphological and physical aspects of the boron pulsed laser deposition were characterized by a Scanning Electron Microscope and an optical profilometer. The films surfaces have a flaky aspect with eventual droplets which had decayed overtime to a more smooth surface. The studied parameters allowed producing a boron coating with the optimal thickness in order to minimize self-absorption effect in the film, thus increasing efficiency.pt_BR
dc.event.siglaSPIEpt_BR
dc.format.extent105250J-1 - 105250J-7pt_BR
dc.identifier.citationCOSTA, PRISCILA; RAELE, MARCUS P.; SAMAD, RICARDO E.; MACHADO, NOE G.P.; VIEIRA JUNIOR, NILSON D.; GENEZINI, FREDERICO A. Femtosecond pulsed laser deposition of a boron thin film aiming at the development of a low-cost neutron detector. In: KAIERLE, STEFAN (ed.); HEINEMANN, STEFAN W. (ed.). In: HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th, January 27 - February 01, 2018, San Francisco, California, USA. <b>Proceedings...</b> Bellingham, WA, USA: Society of Photo-optical Instrumentation Engineers, 2018. p. 105250J-1 - 105250J-7. (SPIE Proceedings Series, 10525). DOI: <a href="https://dx.doi.org/10.1117/12.2285896">10.1117/12.2285896</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/29021.
dc.identifier.doi10.1117/12.2285896pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-6318-6805
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/29021
dc.localBellingham, WA, USApt_BR
dc.local.eventoSan Francisco, California, USApt_BR
dc.publisherSociety of Photo-optical Instrumentation Engineerspt_BR
dc.relation.ispartofseriesSPIE Proceedings Series, 10525pt_BR
dc.rightsopenAccesspt_BR
dc.subjectlaser radiation
dc.subjectneutron detectors
dc.subjectboron
dc.subjectthin films
dc.subjectlasers
dc.subjectablation
dc.subjectscanning electron microscopy
dc.subjectthickness
dc.subjectdeposition
dc.titleFemtosecond pulsed laser deposition of a boron thin film aiming at the development of a low-cost neutron detectorpt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorNOE GABRIEL PINHEIRO MACHADO
ipen.autorFREDERICO ANTONIO GENEZINI
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorRICARDO ELGUL SAMAD
ipen.autorMARCUS PAULO RAELE
ipen.autorPRISCILA COSTA
ipen.codigoautor14630
ipen.codigoautor2045
ipen.codigoautor1582
ipen.codigoautor909
ipen.codigoautor3272
ipen.codigoautor3965
ipen.contributor.ipenauthorNOE GABRIEL PINHEIRO MACHADO
ipen.contributor.ipenauthorFREDERICO ANTONIO GENEZINI
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.contributor.ipenauthorPRISCILA COSTA
ipen.date.recebimento18-08pt_BR
ipen.event.datapadronizada2018pt_BR
ipen.identifier.ipendoc24814pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
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relation.isAuthorOfPublication.latestForDiscoveryb04923ba-9474-4066-b2b6-f52940ecd0f3
sigepi.autor.atividadeCOSTA, PRISCILA:3965:310:Spt_BR
sigepi.autor.atividadeRAELE, MARCUS P.:3272:910:Npt_BR
sigepi.autor.atividadeSAMAD, RICARDO E.:909:930:Npt_BR
sigepi.autor.atividadeMACHADO, NOE G.P.:14630:910:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeGENEZINI, FREDERICO A.:2045:310:Npt_BR
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