Measuring photoelastic dispersion coefficients in material samples with digital holography

Página do item simplificado
dc.contributor.authorSILVA, SIDNEY L. dapt_BR
dc.contributor.authorPRADO, FELIPE M.pt_BR
dc.contributor.authorTOFFOLI, DANIEL J.pt_BR
dc.contributor.authorWETTER, NIKLAUS U.pt_BR
dc.contributor.editorBJELKHAGEN, HANS I.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoSPIE PHOTONICS WEST; SPIE OPTOpt_BR
dc.date.accessioned2020-10-28T14:16:13Z
dc.date.available2020-10-28T14:16:13Z
dc.date.eventoFebruary 1-6, 2020pt_BR
dc.description.abstractPolarized Digital Holography (PHD) is a fast and efficient tool for analyzing mechanical effects in materials. Especially when the task requires non-invasive techniques that do not damage the material in study, the use of PHD has great perspectives. The most common methods of digital reconstruction use the convolution theory to discretize the Huygens- Fresnel integral. When external stresses are applied to photoelastic materials, the relationship between these stresses and phase differences observed by polarization holography is an intrinsic characteristic of the material called the photoelastic dispersion coefficient. In photoelasticity, this coefficient depends on the wavelength. By using PHD the authors show in the present paper that the photoelastic dispersion coefficient also depends on the wavelength in Holography. A Mach- Zehnder interferometer, modified with the inclusion of linear polarizers, was built to verify this effect in a sample of photoelastic material. In this set-up, two coherent light sources with different wavelengths were used. For the analysis, a digital method was created that correlated the mean stresses differences on the photoelastic material sample and the mean phases differences at each distinct wavelength.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipIDFAPESP: 19/23700-4pt_BR
dc.format.extent113060P-1 - 113060P-7pt_BR
dc.identifier.citationSILVA, SIDNEY L. da; PRADO, FELIPE M.; TOFFOLI, DANIEL J.; WETTER, NIKLAUS U. Measuring photoelastic dispersion coefficients in material samples with digital holography. In: BJELKHAGEN, HANS I. (ed.). In: SPIE PHOTONICS WEST; SPIE OPTO, February 1-6, 2020, San Francisco, USA. <b>Proceedings...</b> Washington, USA: SPIE, 2020. p. 113060P-1 - 113060P-7. (Proceedings SPIE 11306, Practical Holography XXXIV: Displays, Materials, and Applications). DOI: <a href="https://dx.doi.org/10.1117/12.2544874">10.1117/12.2544874</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/31564.
dc.identifier.doi10.1117/12.2544874pt_BR
dc.identifier.orcid0000-0002-9379-9530pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-9379-9530
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/31564
dc.localWashington, USApt_BR
dc.local.eventoSan Francisco, USApt_BR
dc.publisherSPIEpt_BR
dc.relation.ispartofseriesProceedings SPIE 11306, Practical Holography XXXIV: Displays, Materials, and Applicationspt_BR
dc.rightsclosedAccesspt_BR
dc.subjectinterferometry
dc.subjectholography
dc.subjectstresses
dc.subjectpolarization
dc.subjectphotoelasticity
dc.titleMeasuring photoelastic dispersion coefficients in material samples with digital holographypt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorNIKLAUS URSUS WETTER
ipen.codigoautor919
ipen.contributor.ipenauthorNIKLAUS URSUS WETTER
ipen.date.recebimento20-10
ipen.event.datapadronizada2020pt_BR
ipen.identifier.ipendoc27336pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication464db0c6-6072-480b-b899-81848893f7eb
relation.isAuthorOfPublication.latestForDiscovery464db0c6-6072-480b-b899-81848893f7eb
sigepi.autor.atividadeWETTER, NIKLAUS U.:919:910:Npt_BR
Pacote Original
Agora exibindo 1 - 1 de 1
Nenhuma Miniatura disponível
Nome:
27336.pdf
Tamanho:
714.33 KB
Formato:
Adobe Portable Document Format
Descrição:
Baixar
Licença do Pacote
Agora exibindo 1 - 1 de 1
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:
Baixar
Coleções
Eventos