A comparative study on surface morphology from the HgIsub(2) semiconductors prepared by different techniques

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dc.contributor.authorMARTINS, JOAO F.T.pt_BR
dc.contributor.authorFERRAZ, CAUE de M.pt_BR
dc.contributor.authorSANTOS, ROBINSON A. dospt_BR
dc.contributor.authorMESQUITA, CARLOS H. dept_BR
dc.contributor.authorMIRANDA, MARGARIDA M.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rdpt_BR
dc.date.accessioned2014-11-17T18:30:42Zpt_BR
dc.date.accessioned2014-11-18T18:23:22Zpt_BR
dc.date.accessioned2015-04-01T20:47:27Z
dc.date.available2014-11-17T18:30:42Zpt_BR
dc.date.available2014-11-18T18:23:22Zpt_BR
dc.date.available2015-04-01T20:47:27Z
dc.date.eventoNovember 24-29, 2013pt_BR
dc.event.siglaINAC; ENAN; ENFIR; ENINpt_BR
dc.identifier.citationMARTINS, JOAO F.T.; FERRAZ, CAUE de M.; SANTOS, ROBINSON A. dos; MESQUITA, CARLOS H. de; MIRANDA, MARGARIDA M. A comparative study on surface morphology from the HgIsub(2) semiconductors prepared by different techniques. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd, November 24-29, 2013, Recife, PE. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/17226.
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/17226pt_BR
dc.local.eventoRecife, PEpt_BR
dc.publisherSão Paulo: ABEN, 2013pt_BR
dc.rightsopenAccesspt_BR
dc.sourceHGI2 SEMICONDUCTOR DETECTORSpt_BR
dc.sourceCRYSTAL GROWTHpt_BR
dc.sourceIMPURITIESpt_BR
dc.sourceMERCURY IODIDESpt_BR
dc.sourceSURFACEpt_BR
dc.sourceMORPHOLOGYpt_BR
dc.sourceSTOICHIOMETRYpt_BR
dc.sourceDMSOpt_BR
dc.subjectbiomasspt_BR
dc.subjectabsorbentspt_BR
dc.subjectchemisorptionpt_BR
dc.subjectwaste waterpt_BR
dc.subjectmolybdenum ionspt_BR
dc.subjecttracer techniquespt_BR
dc.subjectgamma spectroscopypt_BR
dc.subjecthigh-purity ge detectorspt_BR
dc.titleA comparative study on surface morphology from the HgIsub(2) semiconductors prepared by different techniquespt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCAUE DE MELLO FERRAZ
ipen.autorCARLOS HENRIQUE DE MESQUITA
ipen.autorROBINSON ALVES DOS SANTOS
ipen.autorJOAO FRANCISCO TRENCHER MARTINS
ipen.codigoautor10792
ipen.codigoautor1149
ipen.codigoautor7515
ipen.codigoautor5858
ipen.contributor.ipenauthorCAUE DE MELLO FERRAZ
ipen.contributor.ipenauthorCARLOS HENRIQUE DE MESQUITA
ipen.contributor.ipenauthorROBINSON ALVES DOS SANTOS
ipen.contributor.ipenauthorJOAO FRANCISCO TRENCHER MARTINS
ipen.date.recebimento13-12pt_BR
ipen.event.datapadronizada2013pt_BR
ipen.identifier.ipendoc19296pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication68301751-8b20-4f1b-be8f-ae9e920ecaea
relation.isAuthorOfPublication20d22e5e-a0d1-4286-b4d9-20e5ac53cb51
relation.isAuthorOfPublication45bb3200-8c29-4749-b307-e25349039f26
relation.isAuthorOfPublicationf9b49851-75f2-4319-9bcc-105b9e4c2765
relation.isAuthorOfPublication.latestForDiscoveryf9b49851-75f2-4319-9bcc-105b9e4c2765
sigepi.autor.atividadeMARTINS, JOAO F.T.:5858:240:Spt_BR
sigepi.autor.atividadeFERRAZ, CAUÊ de M.:10792:220:Npt_BR
sigepi.autor.atividadeSANTOS, ROBINSON A. DOS:7515:240:Npt_BR
sigepi.autor.atividadeMESQUITA, CARLOS H. DE:1149:240:Npt_BR
sigepi.autor.atividadeMIRANDA, MARGARIDA M.:-1:-1:Npt_BR
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