Characterization of nanostructured HfO2 films using perturbed angular correlation (PAC) technique
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2010
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Hyperfine Interactions
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The hyperfine field at 181Ta lattice sites in nanostructured HfO2 thin films
was studied by the Perturbed Angular Correlation (PAC) technique. Thin oxide
films were deposited by Electron Beam Evaporation on a silicon substrate. The
thickness of the films was ∼100 nm and ∼250 nm. Radioactive 181Hf nuclei were
produced by neutron activation of the film samples in the Brazilian Research Reactor
(IPEN IEA-R1) by the reaction 180Hf(n,γ )181Hf. PAC measurements were carried
out after annealing at 1473 K. The PAC technique allows the determination of the
electric field gradient (EFG) at the probe sites.
Como referenciar
CAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; REDONDO, L.M.; MESTNIK FILHO, J.; SAXENA, R.N.; SOARES, J.C. Characterization of nanostructured HfO2 films using perturbed angular correlation (PAC) technique. Hyperfine Interactions, v. 198, p. 41-45, 2010. DOI: 10.1007/s10751-010-0250-z. Disponível em: http://repositorio.ipen.br/handle/123456789/4563. Acesso em: 26 Feb 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.