Effect of the ohmic drop in a RPC-like chamber for measurements of electron transport parameters

dc.contributor.authorPETRI, ANNA R.
dc.contributor.authorMANGIAROTTI, ALESSIO
dc.contributor.authorGONÇALVES, JOSEMARY A.C.
dc.contributor.authorBUENO, CARMEN C.
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCEpt_BR
dc.date.accessioned2018-01-10T17:05:09Z
dc.date.available2018-01-10T17:05:09Z
dc.date.eventoOctober 22-27, 2017pt_BR
dc.description.abstractThe main advantage of Resistive Plate Chambers (RPCs), applied, for instance, in High-Energy Experiments and Positron Emission Tomography (PET), is that it is spark-protected due to the presence of, at least, one highresistive electrode. However, the ohmic drop across the latter can affect the charge multiplication significantly. In this work, we investigate this effect in a RPC-like chamber. The counter was filled with nitrogen at atmospheric pressure and the primary ionization was produced by the incidence of nitrogen pulsed laser beam on an aluminum cathode. The illumination area of the cathode was measured using a foil of millimetric paper overlaid on this electrode. In this way, the resistance of the glass anode could be estimated using the known resistivity of the glass (ρ=2×1012 Ω.cm). Therefore, the voltage drop across the dielectric was calculated by the product of the current across the gas gap and the anode resistance. In order to mitigate the effect of the resistive electrode, the laser beam intensity was limited by interposing metallic meshes between the laser and the chamber window. The dependence of the ohmic drop from the applied voltage was analyzed. The results obtained shown that, without the meshes, the ohmic drop corresponds up to 7% of the applied voltage, preventing the detection system to reach values of density-normalized electric fields in the gas gap (Eeff/N) higher than 166 Td. By minimizing the laser beam intensity and, consequently, the primary ionization, the ohmic drop represented only 0.2% of the applied voltage, extending the Eeff /N range up to 175 Td.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDFAPESP: 02/04697-1pt_BR
dc.description.sponsorshipIDCNPq: 478859/2009-0pt_BR
dc.event.siglaINACpt_BR
dc.identifier.citationPETRI, ANNA R.; MANGIAROTTI, ALESSIO; GONÇALVES, JOSEMARY A.C.; BUENO, CARMEN C. Effect of the ohmic drop in a RPC-like chamber for measurements of electron transport parameters. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, October 22-27, 2017, Belo Horizonte, MG. <b>Proceedings...</b> Rio de Janeiro, RJ: Associação Brasileira de Energia Nuclear, 2017. Disponível em: http://repositorio.ipen.br/handle/123456789/28273.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/28273
dc.localRio de Janeiro, RJpt_BR
dc.local.eventoBelo Horizonte, MGpt_BR
dc.publisherAssociação Brasileira de Energia Nuclearpt_BR
dc.rightsopenAccesspt_BR
dc.subjectcharged-particle transport
dc.subjectdielectric materials
dc.subjectelectric conductivity
dc.subjectelectric potential
dc.subjectelectrodes
dc.subjectelectrons
dc.subjectmesh generation
dc.subjectvoltage drop
dc.titleEffect of the ohmic drop in a RPC-like chamber for measurements of electron transport parameterspt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.autorANNA RAQUEL PETRI
ipen.codigoautor1592
ipen.codigoautor924
ipen.codigoautor9310
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.contributor.ipenauthorANNA RAQUEL PETRI
ipen.date.recebimento18-01pt_BR
ipen.event.datapadronizada2017pt_BR
ipen.identifier.ipendoc24098pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublicatione54a3422-e1d3-49eb-8618-c5957943d3e4
relation.isAuthorOfPublication.latestForDiscoverye54a3422-e1d3-49eb-8618-c5957943d3e4
sigepi.autor.atividadePETRI, ANNA R.:9310:240:Spt_BR
sigepi.autor.atividadeGONÇALVES, JOSEMARY A.C.:924:240:Npt_BR
sigepi.autor.atividadeBUENO, CARMEN C.:1592:240:Npt_BR

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