Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method
| dc.contributor.author | SANTOS, ROBINSON A. dos | pt_BR |
| dc.contributor.author | COSTA, FABIO E. da | pt_BR |
| dc.contributor.author | MARTINS, JOAO F.T. | pt_BR |
| dc.contributor.author | HAMADA, MARGARIDA M. | pt_BR |
| dc.coverage | Internacional | pt_BR |
| dc.creator.evento | INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st | pt_BR |
| dc.date.accessioned | 2014-11-17T18:19:55Z | pt_BR |
| dc.date.accessioned | 2014-11-18T18:27:33Z | pt_BR |
| dc.date.accessioned | 2015-04-02T05:04:23Z | |
| dc.date.available | 2014-11-17T18:19:55Z | pt_BR |
| dc.date.available | 2014-11-18T18:27:33Z | pt_BR |
| dc.date.available | 2015-04-02T05:04:23Z | |
| dc.date.evento | September 27 - October 2, 2009 | pt_BR |
| dc.event.sigla | INAC; ENAN; ENFIR; ENIN | pt_BR |
| dc.identifier.citation | SANTOS, ROBINSON A. dos; COSTA, FABIO E. da; MARTINS, JOAO F.T.; HAMADA, MARGARIDA M. Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 9th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 16th; MEETING ON NUCLEAR INDUSTRY, 1st, September 27 - October 2, 2009, Rio de Janeiro, RJ. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/16610. | |
| dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/16610 | pt_BR |
| dc.local.evento | Rio de Janeiro, RJ | pt_BR |
| dc.publisher | Sao Paulo: ABEN, 2009 | pt_BR |
| dc.rights | openAccess | pt_BR |
| dc.subject | bridgman method | pt_BR |
| dc.subject | crystal growth | pt_BR |
| dc.subject | defects | pt_BR |
| dc.subject | efficiency | pt_BR |
| dc.subject | electric conductivity | pt_BR |
| dc.subject | energy resolution | pt_BR |
| dc.subject | experimental data | pt_BR |
| dc.subject | impurities | pt_BR |
| dc.subject | performance | pt_BR |
| dc.subject | semiconductor detectors | pt_BR |
| dc.subject | thallium bromides | pt_BR |
| dc.subject | x-ray diffraction | pt_BR |
| dc.title | Performance of thallium bromide semiconductor detectors produced by repeated Bridgman method | pt_BR |
| dc.type | Texto completo de evento | pt_BR |
| dspace.entity.type | Publication | |
| ipen.autor | JOAO FRANCISCO TRENCHER MARTINS | |
| ipen.autor | MARGARIDA MIZUE HAMADA | |
| ipen.autor | FABIO EDUARDO DA COSTA | |
| ipen.autor | ROBINSON ALVES DOS SANTOS | |
| ipen.codigoautor | 5858 | |
| ipen.codigoautor | 1476 | |
| ipen.codigoautor | 384 | |
| ipen.codigoautor | 7515 | |
| ipen.contributor.ipenauthor | JOAO FRANCISCO TRENCHER MARTINS | |
| ipen.contributor.ipenauthor | MARGARIDA MIZUE HAMADA | |
| ipen.contributor.ipenauthor | FABIO EDUARDO DA COSTA | |
| ipen.contributor.ipenauthor | ROBINSON ALVES DOS SANTOS | |
| ipen.date.recebimento | 09-10 | pt_BR |
| ipen.event.datapadronizada | 2009 | pt_BR |
| ipen.identifier.ipendoc | 15264 | pt_BR |
| ipen.notas.internas | Proceedings | pt_BR |
| ipen.type.genre | Artigo | |
| relation.isAuthorOfPublication | f9b49851-75f2-4319-9bcc-105b9e4c2765 | |
| relation.isAuthorOfPublication | 74139eee-5dbd-4dfd-b672-89cb56c5cce5 | |
| relation.isAuthorOfPublication | a4796db3-7719-4922-bfbe-a1789ba6bd51 | |
| relation.isAuthorOfPublication | 45bb3200-8c29-4749-b307-e25349039f26 | |
| relation.isAuthorOfPublication.latestForDiscovery | 45bb3200-8c29-4749-b307-e25349039f26 | |
| sigepi.autor.atividade | SANTOS, ROBINSON A. DOS:7515:220:S | pt_BR |
| sigepi.autor.atividade | COSTA, FABIO E. DA:384:240:N | pt_BR |
| sigepi.autor.atividade | MARTINS, JOAO F.T.:5858:220:N | pt_BR |
| sigepi.autor.atividade | HAMADA, MARGARIDA M.:1476:240:N | pt_BR |
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