Count rate effect on the response of a low-cost PIN diode for electron spectrometry

dc.contributor.authorPETRI, ANNA R.pt_BR
dc.contributor.authorBARROS, SUELEN F.pt_BR
dc.contributor.authorGONCALVES, JOSEMARY A.C.pt_BR
dc.contributor.authorBUENO, CARMEN C.pt_BR
dc.contributor.authorMAIDANA, NORApt_BR
dc.contributor.authorMARTINS, MARCOS N.pt_BR
dc.contributor.authorVANIN, VITO R.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCEpt_BR
dc.date.accessioned2020-01-06T11:16:56Z
dc.date.available2020-01-06T11:16:56Z
dc.date.eventoOctober 21-25, 2019pt_BR
dc.description.abstractThe response of a low-cost Si photodiode model BPX 65 for low-energy electron spectrometry is investigated envisaging its use in measurements of electron multiple elastic scattering. The electron beam with energy between 10-100 keV is delivered by the gun of the Racetrack Microtron at Instituto de Física, Universidade de São Paulo, with an energy dispersion less than 0.5 keV. The energy resolution achieved was less than 3.5 keV, limited mainly by noise from the electronic acquisition chain. For count rates between 20 and 5500 counts/s, the variation on the centroid of electron peak was smaller than 0.4% throughout the energy range. Therefore, the BPX 65 is suitable for electron spectrometry.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDFAPESP: 16/13116-5; 17/12661-2pt_BR
dc.description.sponsorshipIDCNPq: 306331/2016-0pt_BR
dc.event.siglaINACpt_BR
dc.format.extent1207-1213pt_BR
dc.identifier.citationPETRI, ANNA R.; BARROS, SUELEN F.; GONCALVES, JOSEMARY A.C.; BUENO, CARMEN C.; MAIDANA, NORA; MARTINS, MARCOS N.; VANIN, VITO R. Count rate effect on the response of a low-cost PIN diode for electron spectrometry. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, October 21-25, 2019, Santos, SP. <b>Proceedings...</b> Rio de Janeiro: Associação Brasileira de Energia Nuclear, 2019. p. 1207-1213. Disponível em: http://repositorio.ipen.br/handle/123456789/30559.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30559
dc.localRio de Janeiropt_BR
dc.local.eventoSantos, SPpt_BR
dc.publisherAssociação Brasileira de Energia Nuclear
dc.rightsopenAccesspt_BR
dc.subjectelectron beams
dc.subjectsi semiconductor detectors
dc.subjectsemiconductor diodes
dc.subjectsilicon diodes
dc.subjectcounting rates
dc.subjectelectron beams
dc.subjectphotodiodes
dc.subjectelectron diffraction
dc.subjectenergy spectra
dc.subjectelectron detection
dc.subjectelectron spectroscopy
dc.titleCount rate effect on the response of a low-cost PIN diode for electron spectrometrypt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento20-01
ipen.event.datapadronizada2019pt_BR
ipen.identifier.ipendoc26209pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeBUENO, CARMEN C.:1592:240:Npt_BR
sigepi.autor.atividadeGONCALVES, JOSEMARY A.C.:924:240:Npt_BR

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