Boron film thickness determination to develop a low cost neutron using Monte Carlo Method
dc.contributor.author | COSTA, PRISCILA | |
dc.contributor.author | RAELE, MARCUS P. | |
dc.contributor.author | YORIYAZ, HELIO | |
dc.contributor.author | SIQUEIRA, PAULO de T.D. | |
dc.contributor.author | ZAHN, GUILHERME S. | |
dc.contributor.author | GENEZINI, FREDERICO A. | |
dc.coverage | Internacional | pt_BR |
dc.creator.evento | INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 12th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 19th; MEETING ON NUCLEAR INDUSTRY, 4th | pt_BR |
dc.date.accessioned | 2015-11-09T12:19:34Z | |
dc.date.available | 2015-11-09T12:19:34Z | |
dc.date.evento | October 4-9, 2015 | pt_BR |
dc.event.sigla | INAC; ENAN; ENFIR; ENIN | pt_BR |
dc.identifier.citation | COSTA, PRISCILA; RAELE, MARCUS P.; YORIYAZ, HELIO; SIQUEIRA, PAULO de T.D.; ZAHN, GUILHERME S.; GENEZINI, FREDERICO A. Boron film thickness determination to develop a low cost neutron using Monte Carlo Method. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 12th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 19th; MEETING ON NUCLEAR INDUSTRY, 4th, October 4-9, 2015, São Paulo, SP. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/25140. | |
dc.identifier.orcid | https://orcid.org/0000-0003-4023-236X | |
dc.identifier.orcid | https://orcid.org/0000-0002-6318-6805 | |
dc.identifier.orcid | https://orcid.org/0000-0003-3237-8588 | |
dc.identifier.orcid | https://orcid.org/0000-0002-6461-6766 | |
dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/25140 | |
dc.local.evento | São Paulo, SP | pt_BR |
dc.rights | openAccess | pt_BR |
dc.subject | boron | |
dc.subject | thin films | |
dc.subject | monte carlo method | |
dc.subject | neutron flux | |
dc.subject | neutron detection | |
dc.subject | alpha particles | |
dc.subject | thermal neutrons | |
dc.subject | charged particles | |
dc.subject | computerized simulation | |
dc.subject | photodiodes | |
dc.subject | silicon | |
dc.subject | thickness | |
dc.title | Boron film thickness determination to develop a low cost neutron using Monte Carlo Method | pt_BR |
dc.type | Texto completo de evento | pt_BR |
dspace.entity.type | Publication | |
ipen.autor | HELIO YORIYAZ | |
ipen.autor | FREDERICO ANTONIO GENEZINI | |
ipen.autor | GUILHERME SOARES ZAHN | |
ipen.autor | PAULO DE TARSO DALLEDONE SIQUEIRA | |
ipen.autor | MARCUS PAULO RAELE | |
ipen.autor | PRISCILA COSTA | |
ipen.codigoautor | 80 | |
ipen.codigoautor | 2045 | |
ipen.codigoautor | 950 | |
ipen.codigoautor | 968 | |
ipen.codigoautor | 3272 | |
ipen.codigoautor | 3965 | |
ipen.contributor.ipenauthor | HELIO YORIYAZ | |
ipen.contributor.ipenauthor | FREDERICO ANTONIO GENEZINI | |
ipen.contributor.ipenauthor | GUILHERME SOARES ZAHN | |
ipen.contributor.ipenauthor | PAULO DE TARSO DALLEDONE SIQUEIRA | |
ipen.contributor.ipenauthor | MARCUS PAULO RAELE | |
ipen.contributor.ipenauthor | PRISCILA COSTA | |
ipen.date.recebimento | 15-10 | pt_BR |
ipen.event.datapadronizada | 2015 | pt_BR |
ipen.identifier.ipendoc | 21130 | pt_BR |
ipen.notas.internas | Proceedings | pt_BR |
ipen.type.genre | Artigo | |
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sigepi.autor.atividade | COSTA, PRISCILA:3965:1120:S | |
sigepi.autor.atividade | RAELE, MARCUS P.:3272:910:N | |
sigepi.autor.atividade | YORIYAZ, HELIO:80:420:N | |
sigepi.autor.atividade | ZAHN, GUILHERME S.:950:310:N | |
sigepi.autor.atividade | GENEZINI, FREDERICO A.:2045:310:N | |
sigepi.autor.atividade | SIQUEIRA, PAULO DE T.D.:968:420:S |