Polarization sensitive and Mueller matrix OCT measurements and data analysis

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dc.contributor.authorRAELE, MARCUS P.pt_BR
dc.contributor.authorAMARAL, MARCELLO M.pt_BR
dc.contributor.authorVIEIRA JUNIOR, NILSON D.pt_BR
dc.contributor.authorFREITAS, ANDERSON Z.pt_BR
dc.contributor.editorFUJIMOTO, JAMES G.pt_BR
dc.contributor.editorIZATT, JOSEPH A.pt_BR
dc.contributor.editorTUCHIN, VALERY V.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoOPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE, XVpt_BR
dc.date.accessioned2014-11-17T17:09:14Zpt_BR
dc.date.accessioned2014-11-18T17:00:00Zpt_BR
dc.date.accessioned2015-04-01T21:07:49Z
dc.date.available2014-11-17T17:09:14Zpt_BR
dc.date.available2014-11-18T17:00:00Zpt_BR
dc.date.available2015-04-01T21:07:49Z
dc.date.eventoJanuary 24-26pt_BR
dc.format.extent788939-1 - 788939-9pt_BR
dc.identifier.citationRAELE, MARCUS P.; AMARAL, MARCELLO M.; VIEIRA JUNIOR, NILSON D.; FREITAS, ANDERSON Z. Polarization sensitive and Mueller matrix OCT measurements and data analysis. In: FUJIMOTO, JAMES G. (ed.); IZATT, JOSEPH A. (ed.); TUCHIN, VALERY V. (ed.). In: OPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE, XV, January 24-26, San Francisco, California. <b>Proceedings...</b> Bellingham, Washington: Society of Photho-optical Instrumentation Engineers, 2011. p. 788939-1 - 788939-9. Disponível em: http://repositorio.ipen.br/handle/123456789/12496.
dc.identifier.orcidhttps://orcid.org/0000-0002-5018-9126
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/12496pt_BR
dc.localBellingham, Washingtonpt_BR
dc.local.eventoSan Francisco, Californiapt_BR
dc.publisherSociety of Photho-optical Instrumentation Engineerspt_BR
dc.rightsopenAccesspt_BR
dc.subjecttomographypt_BR
dc.subjectoptical systemspt_BR
dc.subjectcoherence lengthpt_BR
dc.subjectmatricespt_BR
dc.subjectpolarizationpt_BR
dc.subjectinterferometerspt_BR
dc.titlePolarization sensitive and Mueller matrix OCT measurements and data analysispt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorANDERSON ZANARDI DE FREITAS
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorMARCELLO MAGRI AMARAL
ipen.autorMARCUS PAULO RAELE
ipen.codigoautor880
ipen.codigoautor1582
ipen.codigoautor3443
ipen.codigoautor3272
ipen.contributor.ipenauthorANDERSON ZANARDI DE FREITAS
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorMARCELLO MAGRI AMARAL
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.date.recebimento12-04pt_BR
ipen.event.datapadronizada2011pt_BR
ipen.identifier.ipendoc17637pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
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relation.isAuthorOfPublicationb5e4f489-bfb7-4e48-ae3a-eced2bb93a16
relation.isAuthorOfPublicatione73cdf88-445f-4943-ba23-343560759a3f
relation.isAuthorOfPublicationd6670c99-6533-4da0-b054-4a459258a12f
relation.isAuthorOfPublication.latestForDiscoveryd6670c99-6533-4da0-b054-4a459258a12f
sigepi.autor.atividadeRAELE, MARCUS P.:3272:910:Spt_BR
sigepi.autor.atividadeAMARAL, MARCELLO M.:3443:-1:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeFREITAS, ANDERSON Z.:880:920:Npt_BR

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