Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor
| dc.contributor.author | HAMADA, M.M. | pt_BR |
| dc.contributor.author | OLIVEIRA, I.B. | pt_BR |
| dc.contributor.author | ARMELIN, M.J. | pt_BR |
| dc.contributor.author | MESQUITA, C.H. | pt_BR |
| dc.contributor.editor | WEHE, D.K. | pt_BR |
| dc.contributor.editor | GRIFFIN, H.C. | pt_BR |
| dc.contributor.editor | ROGERS, W.L. | pt_BR |
| dc.coverage | Internacional | pt_BR |
| dc.creator.evento | SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th | pt_BR |
| dc.date.accessioned | 2014-11-17T17:55:06Z | pt_BR |
| dc.date.accessioned | 2014-11-18T18:53:41Z | pt_BR |
| dc.date.accessioned | 2015-04-01T23:33:42Z | |
| dc.date.available | 2014-11-17T17:55:06Z | pt_BR |
| dc.date.available | 2014-11-18T18:53:41Z | pt_BR |
| dc.date.available | 2015-04-01T23:33:42Z | |
| dc.date.evento | May 21-23, 2002 | pt_BR |
| dc.format.extent | 517-520 | pt_BR |
| dc.identifier.citation | HAMADA, M.M.; OLIVEIRA, I.B.; ARMELIN, M.J.; MESQUITA, C.H. Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor. In: WEHE, D.K. (ed.); GRIFFIN, H.C. (ed.); ROGERS, W.L. (ed.). In: SYMPOSIUM ON RADIATION MEASUREMENTS AND APPLICATIONS, 10th, May 21-23, 2002, Ann Arbor, MI, USA. <b>Proceedings...</b> p. 517-520. Disponível em: http://repositorio.ipen.br/handle/123456789/15378. | |
| dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/15378 | pt_BR |
| dc.local.evento | Ann Arbor, MI, USA | pt_BR |
| dc.publisher | Amsterdam: Elsevier, 2003 | pt_BR |
| dc.rights | openAccess | pt_BR |
| dc.source | Publicado em: Nuclear Instruments and Methods in Physics Research, , v. 505, n. 1/2, 2003. Section ASection A. p. 517-520 | pt_BR |
| dc.subject | semiconductor materials | pt_BR |
| dc.subject | lead iodides | pt_BR |
| dc.subject | crystals | pt_BR |
| dc.subject | crystal growth | pt_BR |
| dc.subject | bridgman method | pt_BR |
| dc.subject | purification | pt_BR |
| dc.subject | zone refining | pt_BR |
| dc.subject | impurities | pt_BR |
| dc.subject | trace amounts | pt_BR |
| dc.subject | neutron activation analysis | pt_BR |
| dc.subject | semiconductor detectors | pt_BR |
| dc.subject | radiation detectors | pt_BR |
| dc.title | Trace impurities analysis determined by neutron activation in the PbIsub(2) crystal semiconductor | pt_BR |
| dc.type | Texto completo de evento | pt_BR |
| dspace.entity.type | Publication | |
| ipen.autor | CARLOS HENRIQUE DE MESQUITA | |
| ipen.autor | MARIA JOSE AGUIRRE ARMELIN | |
| ipen.autor | ICIMONE BRAGA DE OLIVEIRA | |
| ipen.autor | MARGARIDA MIZUE HAMADA | |
| ipen.codigoautor | 1149 | |
| ipen.codigoautor | 1373 | |
| ipen.codigoautor | 2501 | |
| ipen.codigoautor | 1476 | |
| ipen.contributor.ipenauthor | CARLOS HENRIQUE DE MESQUITA | |
| ipen.contributor.ipenauthor | MARIA JOSE AGUIRRE ARMELIN | |
| ipen.contributor.ipenauthor | ICIMONE BRAGA DE OLIVEIRA | |
| ipen.contributor.ipenauthor | MARGARIDA MIZUE HAMADA | |
| ipen.date.recebimento | 04-08 | pt_BR |
| ipen.event.datapadronizada | 2002 | pt_BR |
| ipen.identifier.ipendoc | 09791 | pt_BR |
| ipen.notas.internas | Proceedings | pt_BR |
| ipen.type.genre | Artigo | |
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| relation.isAuthorOfPublication.latestForDiscovery | 74139eee-5dbd-4dfd-b672-89cb56c5cce5 | |
| sigepi.autor.atividade | HAMADA, M.M.:1476:5:S | pt_BR |
| sigepi.autor.atividade | OLIVEIRA, I.B.:2501:-1:N | pt_BR |
| sigepi.autor.atividade | ARMELIN, M.J.:1373:7:N | pt_BR |
| sigepi.autor.atividade | MESQUITA, C.H.:1149:5:N | pt_BR |
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