Enhance resolution on OCT profilometry measurements using harmonic artifacts
| dc.contributor.author | RAELE, MARCUS P. | |
| dc.contributor.author | PRETTO, LUCAS R. de | |
| dc.contributor.author | FREITAS, ANDERSON Z. de | |
| dc.contributor.editor | FUJIMOTO, JAMES G. | |
| dc.contributor.editor | IZZATT, JOSEPH A. | |
| dc.contributor.editor | TUCHIN, VALERY V. | |
| dc.coverage | Internacional | pt_BR |
| dc.creator.evento | OPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE, 19th | pt_BR |
| dc.date.accessioned | 2015-07-30T18:21:27Z | |
| dc.date.available | 2015-07-30T18:21:27Z | |
| dc.date.evento | February 7, 2015 | pt_BR |
| dc.event.sigla | SPIE | pt_BR |
| dc.format.extent | 93123Q-1 - 93123Q-8 | pt_BR |
| dc.identifier.citation | RAELE, MARCUS P.; PRETTO, LUCAS R. de; FREITAS, ANDERSON Z. de. Enhance resolution on OCT profilometry measurements using harmonic artifacts. In: FUJIMOTO, JAMES G. (ed.); IZZATT, JOSEPH A. (ed.); TUCHIN, VALERY V. (ed.). In: OPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE, 19th, February 7, 2015, San Francisco, California, United States. <b>Proceedings...</b> p. 93123Q-1 - 93123Q-8. (SPIE Proceedings Series, 9312). Disponível em: http://repositorio.ipen.br/handle/123456789/23870. | |
| dc.identifier.orcid | https://orcid.org/0000-0002-5018-9126 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-6461-6766 | |
| dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/23870 | |
| dc.local.evento | San Francisco, California, United States | pt_BR |
| dc.publisher | Society of Photho-optical Instrumentation Engineers | pt_BR |
| dc.relation.ispartofseries | SPIE Proceedings Series, 9312 | |
| dc.rights | openAccess | pt_BR |
| dc.subject | coherent radiation | |
| dc.subject | interferometry | |
| dc.subject | harmonics | |
| dc.subject | resolution | |
| dc.subject | images | |
| dc.subject | fourier transformation | |
| dc.subject | tomography | |
| dc.subject | optical models | |
| dc.title | Enhance resolution on OCT profilometry measurements using harmonic artifacts | pt_BR |
| dc.type | Texto completo de evento | pt_BR |
| dspace.entity.type | Publication | |
| ipen.autor | ANDERSON ZANARDI DE FREITAS | |
| ipen.autor | LUCAS RAMOS DE PRETTO | |
| ipen.autor | MARCUS PAULO RAELE | |
| ipen.codigoautor | 880 | |
| ipen.codigoautor | 11268 | |
| ipen.codigoautor | 3272 | |
| ipen.contributor.ipenauthor | ANDERSON ZANARDI DE FREITAS | |
| ipen.contributor.ipenauthor | LUCAS RAMOS DE PRETTO | |
| ipen.contributor.ipenauthor | MARCUS PAULO RAELE | |
| ipen.date.recebimento | 15-07 | pt_BR |
| ipen.event.datapadronizada | 2015 | pt_BR |
| ipen.identifier.ipendoc | 20913 | pt_BR |
| ipen.notas.internas | Proceedings | pt_BR |
| ipen.type.genre | Artigo | |
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| relation.isAuthorOfPublication.latestForDiscovery | d6670c99-6533-4da0-b054-4a459258a12f | |
| sigepi.autor.atividade | RAELE, MARCUS P.:3272:910:S | |
| sigepi.autor.atividade | PRETTO, LUCAS R. DE:11268:920:N | |
| sigepi.autor.atividade | FREITAS, ANDERSON Z. DE:880:920:N |