Comparative evaluation of the performance of thin diodes used as on-line dosimeters in radiation processing applications

dc.contributor.authorGONCALVES, JOSEMARY A.C.pt_BR
dc.contributor.authorMANGIAROTTI, ALESSIOpt_BR
dc.contributor.authorBUENO, CARMEN C.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCEpt_BR
dc.date.accessioned2019-11-27T14:08:37Z
dc.date.available2019-11-27T14:08:37Z
dc.date.eventoOctober 21-25, 2019pt_BR
dc.description.abstractIn this work, we report a comparison between the performance of two samples of commercial PIN photodiodes (SFH206K from OsramÒ and S2506-04 from HamamatsuÒ) mainly addressing the variation of their current sensitivities with accumulated dose ranging from 0-15 kGy. All the results so far obtained have revealed that the radiation induced currents are linearly dependent on dose rates from 3.65 to 55.64 Gy/h. The current sensitivity of both unirradiated diodes (0.178 nA.h/Gy.mm3) slightly decreases with accumulated dose, namely 0.32%/kGy (SFH206K) and 1.4%/kGy (S2506-04). Although the SFH206K device compares favorably with the S2506-04, both diodes can be considered as a low budge alternative, good enough for on-line dosimetry applications in the field of radiation processing.pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDCNPq: 306331/2016-0pt_BR
dc.event.siglaINACpt_BR
dc.format.extent192-197pt_BR
dc.identifier.citationGONCALVES, JOSEMARY A.C.; MANGIAROTTI, ALESSIO; BUENO, CARMEN C. Comparative evaluation of the performance of thin diodes used as on-line dosimeters in radiation processing applications. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, October 21-25, 2019, Santos, SP. <b>Proceedings...</b> Rio de Janeiro: Associação Brasileira de Energia Nuclear, 2019. p. 192-197. Disponível em: http://repositorio.ipen.br/handle/123456789/30347.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30347
dc.localRio de Janeiropt_BR
dc.local.eventoSantos, SPpt_BR
dc.publisherAssociação Brasileira de Energia Nuclear
dc.rightsopenAccesspt_BR
dc.subjectcobalt 60
dc.subjectcomparative evaluations
dc.subjectdose rates
dc.subjectdosemeters
dc.subjectelectrical faults
dc.subjectgamma radiation
dc.subjectperformance
dc.subjectphotodiodes
dc.subjectsensitivity
dc.titleComparative evaluation of the performance of thin diodes used as on-line dosimeters in radiation processing applicationspt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento19-11
ipen.event.datapadronizada2019pt_BR
ipen.identifier.ipendoc26135pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeBUENO, CARMEN C.:1592:240:Npt_BR
sigepi.autor.atividadeGONCALVES, JOSEMARY A.C.:924:240:Spt_BR

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