Roughness measurement methodology according to DIN 4768 using optical coherence tomography (OCT)

Página do item simplificado
dc.contributor.authorAMARAL, MARCELLO M.pt_BR
dc.contributor.authorRAELE, MARCUS P.pt_BR
dc.contributor.authorCALY, JOSE P.pt_BR
dc.contributor.authorSAMAD, RICARDO E.pt_BR
dc.contributor.authorVIEIRA JUNIOR, NILSON D.pt_BR
dc.contributor.authorFREITAS, ANDERSON Z.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoSPIE EUROPE: OPTICAL METROLOGYpt_BR
dc.date.accessioned2014-11-17T18:21:59Zpt_BR
dc.date.accessioned2014-11-18T18:29:05Zpt_BR
dc.date.accessioned2015-04-02T02:50:27Z
dc.date.available2014-11-17T18:21:59Zpt_BR
dc.date.available2014-11-18T18:29:05Zpt_BR
dc.date.available2015-04-02T02:50:27Z
dc.date.evento14-18 June, 2009pt_BR
dc.identifier.citationAMARAL, MARCELLO M.; RAELE, MARCUS P.; CALY, JOSE P.; SAMAD, RICARDO E.; VIEIRA JUNIOR, NILSON D.; FREITAS, ANDERSON Z. Roughness measurement methodology according to DIN 4768 using optical coherence tomography (OCT). In: SPIE EUROPE: OPTICAL METROLOGY, 14-18 June, 2009, Munique, Alemanha. <b>Proceedings...</b> (SPIE Proceedings Series, 7390). Disponível em: http://repositorio.ipen.br/handle/123456789/16657.
dc.identifier.orcidhttps://orcid.org/0000-0002-5018-9126
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/16657pt_BR
dc.local.eventoMunique, Alemanhapt_BR
dc.publisherSociety of Photho-optical Instrumentation Engineers
dc.relation.ispartofseriesSPIE Proceedings Series, 7390
dc.rightsopenAccesspt_BR
dc.subjectoptical propertiespt_BR
dc.subjecttomographypt_BR
dc.subjectroughnesspt_BR
dc.subjectsurface propertiespt_BR
dc.subjectstandardspt_BR
dc.titleRoughness measurement methodology according to DIN 4768 using optical coherence tomography (OCT)pt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorANDERSON ZANARDI DE FREITAS
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorRICARDO ELGUL SAMAD
ipen.autorJOSE PUCCI CALY
ipen.autorMARCUS PAULO RAELE
ipen.autorMARCELLO MAGRI AMARAL
ipen.codigoautor880
ipen.codigoautor1582
ipen.codigoautor909
ipen.codigoautor4001
ipen.codigoautor3272
ipen.codigoautor3443
ipen.contributor.ipenauthorANDERSON ZANARDI DE FREITAS
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.contributor.ipenauthorJOSE PUCCI CALY
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.contributor.ipenauthorMARCELLO MAGRI AMARAL
ipen.date.recebimento09-10pt_BR
ipen.event.datapadronizada2009pt_BR
ipen.identifier.ipendoc14126pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationa8d821f0-a0a4-4d52-b582-5c5d0afce8f5
relation.isAuthorOfPublicationb5e4f489-bfb7-4e48-ae3a-eced2bb93a16
relation.isAuthorOfPublicationb9c43c0c-87a6-4ebd-92ff-2515c4ac1d34
relation.isAuthorOfPublicatione3676a75-81e6-498a-a7f3-d2b4c25e6e09
relation.isAuthorOfPublicationd6670c99-6533-4da0-b054-4a459258a12f
relation.isAuthorOfPublicatione73cdf88-445f-4943-ba23-343560759a3f
relation.isAuthorOfPublication.latestForDiscoverye73cdf88-445f-4943-ba23-343560759a3f
sigepi.autor.atividadeAMARAL, MARCELLO M.:3443:-1:Npt_BR
sigepi.autor.atividadeRAELE, MARCUS P.:3272:920:Npt_BR
sigepi.autor.atividadeCALY, JOSE P.:4001:920:Npt_BR
sigepi.autor.atividadeSAMAD, RICARDO E.:909:930:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeFREITAS, ANDERSON Z.:880:920:Npt_BR
Pacote Original
Agora exibindo 1 - 1 de 1
Imagem de Miniatura
Nome:
14126.pdf
Tamanho:
6.09 MB
Formato:
Adobe Portable Document Format
Baixar
Coleções
Eventos