Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry

dc.contributor.authorPASCOALINO, K.pt_BR
dc.contributor.authorGONCALVES, J.A.C.pt_BR
dc.contributor.authorCAMARGO, F.pt_BR
dc.contributor.authorBUENO, C.C.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCEpt_BR
dc.date.accessioned2021-12-28T16:22:58Z
dc.date.available2021-12-28T16:22:58Z
dc.date.eventoNovember 29 - December 2, 2021pt_BR
dc.event.siglaINACpt_BR
dc.identifier.citationPASCOALINO, K.; GONCALVES, J.A.C.; CAMARGO, F.; BUENO, C.C. Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, November 29 - December 2, 2021, Online. <b>Proceedings...</b> Rio de Janeiro: Associação Brasileira de Energia Nuclear, 2021. Disponível em: http://repositorio.ipen.br/handle/123456789/32500.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/32500
dc.localRio de Janeiropt_BR
dc.local.eventoOnlinept_BR
dc.publisherAssociação Brasileira de Energia Nuclearpt_BR
dc.rightsopenAccesspt_BR
dc.subjectalpha spectroscopy
dc.subjectdosimetry
dc.subjectenergy losses
dc.subjectlayers
dc.subjectphotodiodes
dc.subjectradiation protection
dc.subjectsilicon
dc.subjectthickness
dc.titleMeasurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometrypt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorFABIO DE CAMARGO
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.autorKELLY CRISTINA DA SILVA PASCOALINO
ipen.codigoautor1592
ipen.codigoautor2764
ipen.codigoautor924
ipen.codigoautor6608
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorFABIO DE CAMARGO
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.contributor.ipenauthorKELLY CRISTINA DA SILVA PASCOALINO
ipen.date.recebimento21-12
ipen.event.datapadronizada2021pt_BR
ipen.identifier.ipendoc28241pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublicationbf2a9a35-1434-4c5d-9bf8-a87d542cb728
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication3635b910-bf6b-403f-9a41-6b16dcd43d8a
relation.isAuthorOfPublication.latestForDiscovery3635b910-bf6b-403f-9a41-6b16dcd43d8a
sigepi.autor.atividadeBUENO, C.C.:1592:240:Npt_BR
sigepi.autor.atividadeCAMARGO, F.:2764:-1:Npt_BR
sigepi.autor.atividadeGONCALVES, J.A.C.:924:240:Npt_BR
sigepi.autor.atividadePASCOALINO, K.:6608:-1:Spt_BR

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