Diagnostic X-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodes

dc.contributor.authorGONÇALVES, JOSEMARY A.C.
dc.contributor.authorBARROS, VINICIUS S.M.
dc.contributor.authorASFORA, VIVIANE K.
dc.contributor.authorKHOURY, HELEN J.
dc.contributor.authorBUENO, CARMEN C.
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL NUCLEAR ATLANTIC CONFERENCEpt_BR
dc.date.accessioned2018-01-08T11:57:15Z
dc.date.available2018-01-08T11:57:15Z
dc.date.eventoOctober 22-27, 2017pt_BR
dc.description.abstractThe results obtained with a standard float zone (FZ) silicon diode, processed at the Helsinki Institute of Physics, used as on-line diagnostic X-ray dosimeter are described in this work. The device was connected in the shortcircuit current mode to the input of an integrating electrometer. The response repeatability and the current sensitivity coefficient of the diode were measured with diagnostic X-ray beams in the range of 40-80 kV. The dose-response of the device, evaluated from 10 mGy up to 500 mGy, was linear with high charge sensitivity. Nevertheless, significant energy dependence was observed in the charge sensitivity of FZ device for energies below 70 kV. The dosimetric characteristics of this FZ diode were compared to those of an XRA-50 commercial Si diode, specially designed to X-ray dosimetry. The results obtained with the FZ diode evidenced that it can be an alternative choice for diagnostic X-ray dosimetry, although it needs to be calibrated for individual X-ray beam energies. The studies of long-term stability and the radiation hardness of these diodes are under way.pt_BR
dc.event.siglaINACpt_BR
dc.identifier.citationGONÇALVES, JOSEMARY A.C.; BARROS, VINICIUS S.M.; ASFORA, VIVIANE K.; KHOURY, HELEN J.; BUENO, CARMEN C. Diagnostic X-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodes. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, October 22-27, 2017, Belo Horizonte, MG. <b>Proceedings...</b> Rio de Janeiro, RJ: Associação Brasileira de Energia Nuclear, 2017. Disponível em: http://repositorio.ipen.br/handle/123456789/28235.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/28235
dc.localRio de Janeiro, RJpt_BR
dc.local.eventoBelo Horizonte, MGpt_BR
dc.publisherAssociação Brasileira de Energia Nuclearpt_BR
dc.rightsopenAccesspt_BR
dc.subjectbeams
dc.subjectcomparative evaluations
dc.subjectdiagnosis
dc.subjectdose rates
dc.subjectenergy dependence
dc.subjectsensitivity
dc.subjectsilicon diodes
dc.subjectzone melting
dc.titleDiagnostic X-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodespt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento18-01pt_BR
ipen.event.datapadronizada2017pt_BR
ipen.identifier.ipendoc24060pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeGONÇALVES, JOSEMARY A.C.:924:240:Spt_BR
sigepi.autor.atividadeBUENO, CARMEN C.:1592:240:Npt_BR

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