Direct nanoplastics detection below the diffraction limit using micro Raman

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dc.contributor.authorBERECZKI, ALLANpt_BR
dc.contributor.authorDIPOLD, JESSICApt_BR
dc.contributor.authorFREITAS, ANDERSON Z.pt_BR
dc.contributor.authorWETTER, NIKLAUSpt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoCONFERENCE ON LASERS AND ELECTRO-OPTICS: APPLICATIONS AND TECHNOLOGYpt_BR
dc.date.accessioned2024-02-02T12:12:31Z
dc.date.available2024-02-02T12:12:31Z
dc.date.eventoMay 7-12, 2023pt_BR
dc.description.abstractRaman spectra of polystyrene nanoparticles of 50 nm diameter were directly measured using micro-Raman spectroscopy. Data analysis demonstrated that particles as small as 20 nm could be directly measured with this simple and robust technique.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipInstituto de Pesquisas Energéticas e Nucleares (IPEN)pt_BR
dc.description.sponsorshipIDFAPESP: 18/19240-5; 21/11316-5; 21/04334-7pt_BR
dc.description.sponsorshipIDIPEN: 2020.06.IPEN.33pt_BR
dc.event.siglaCLEO-ATpt_BR
dc.identifier.citationBERECZKI, ALLAN; DIPOLD, JESSICA; FREITAS, ANDERSON Z.; WETTER, NIKLAUS. Direct nanoplastics detection below the diffraction limit using micro Raman. In: CONFERENCE ON LASERS AND ELECTRO-OPTICS: APPLICATIONS AND TECHNOLOGY, May 7-12, 2023, San Jose, CA, USA. <b>Proceedings...</b> Washington, DC, USA: Optica Publishing Group, 2023. DOI: <a href="https://dx.doi.org/10.1364/CLEO_AT.2023.ATh3I.2">10.1364/CLEO_AT.2023.ATh3I.2</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/34448.
dc.identifier.doi10.1364/CLEO_AT.2023.ATh3I.2pt_BR
dc.identifier.orcid0000-0002-9379-9530pt_BR
dc.identifier.orcid0000-0002-5018-9126pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-9379-9530
dc.identifier.orcidhttps://orcid.org/0000-0002-5018-9126
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/34448
dc.localWashington, DC, USApt_BR
dc.local.eventoSan Jose, CA, USApt_BR
dc.publisherOptica Publishing Grouppt_BR
dc.rightsclosedAccesspt_BR
dc.subjectnanoparticles
dc.subjectplastics
dc.subjectraman spectra
dc.subjectpolystyrene
dc.subjectenvironment
dc.subjectenvironmental impacts
dc.subjectpollution
dc.titleDirect nanoplastics detection below the diffraction limit using micro Ramanpt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorALLAN BERECZKI
ipen.autorJESSICA DIPOLD
ipen.autorNIKLAUS URSUS WETTER
ipen.autorANDERSON ZANARDI DE FREITAS
ipen.codigoautor12080
ipen.codigoautor15190
ipen.codigoautor919
ipen.codigoautor880
ipen.contributor.ipenauthorALLAN BERECZKI
ipen.contributor.ipenauthorJESSICA DIPOLD
ipen.contributor.ipenauthorNIKLAUS URSUS WETTER
ipen.contributor.ipenauthorANDERSON ZANARDI DE FREITAS
ipen.date.recebimento24-02
ipen.event.datapadronizada2023pt_BR
ipen.identifier.ipendoc30047pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationc1a4f374-98c2-4d09-a07b-df64015613ed
relation.isAuthorOfPublicatione269f6bf-703a-42ad-8f88-b8a90dbed0ea
relation.isAuthorOfPublication464db0c6-6072-480b-b899-81848893f7eb
relation.isAuthorOfPublicationa8d821f0-a0a4-4d52-b582-5c5d0afce8f5
relation.isAuthorOfPublication.latestForDiscoveryc1a4f374-98c2-4d09-a07b-df64015613ed
sigepi.autor.atividadeWETTER, NIKLAUS:919:910:Npt_BR
sigepi.autor.atividadeFREITAS, ANDERSON Z.:880:920:Npt_BR
sigepi.autor.atividadeDIPOLD, JESSICA:15190:910:Npt_BR
sigepi.autor.atividadeBERECZKI, ALLAN:12080:910:Spt_BR

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