DANIEL DE ABREU ROSSETTO

Resultados de Busca

Agora exibindo 1 - 2 de 2

Characterization of nanostructured HfO2 films using perturbed angular correlation (PAC) technique
2010 - CAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; REDONDO, L.M.; MESTNIK FILHO, J.; SAXENA, R.N.; SOARES, J.C.
The hyperfine field at 181Ta lattice sites in nanostructured HfO2 thin films was studied by the Perturbed Angular Correlation (PAC) technique. Thin oxide films were deposited by Electron Beam Evaporation on a silicon substrate. The thickness of the films was ∼100 nm and ∼250 nm. Radioactive 181Hf nuclei were produced by neutron activation of the film samples in the Brazilian Research Reactor (IPEN IEA-R1) by the reaction 180Hf(n,γ )181Hf. PAC measurements were carried out after annealing at 1473 K. The PAC technique allows the determination of the electric field gradient (EFG) at the probe sites.
Characterization of nanostructured HfOsub(2) films using RBS and PAC
2012 - CAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; ALVES, E.; BARRADAS, N.P.; FRANCO, N.; REDONDO, L.M.; LOPES, A.M.L.; SOARES, J.C.