In this work, we present a facility to study errors in digital devices exposed to
thermal neutrons from a beam hole in the IEA-R1 nuclear reactor, as well as the long-lived
isotopes produced in the irradiation of digital electronic devices under a slow neutron field.
Preliminary results obtained with the analysis of a 28nm SRAM-based Xilinx Zynq-7000 FPGA
are presented.