Measurement of refractive nonlinearities in GaAs above bandgap energy

dc.contributor.authorMARTINELLI, M.pt_BR
dc.contributor.authorGOMES, L.pt_BR
dc.contributor.authorHOROWICZ, R.J.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2014-07-31T11:33:11Zpt_BR
dc.date.accessioned2014-07-31T11:51:04Z
dc.date.available2014-07-31T11:33:11Zpt_BR
dc.date.available2014-07-31T11:51:04Z
dc.date.issued2000pt_BR
dc.format.extent6193-6196pt_BR
dc.identifier.citationMARTINELLI, M.; GOMES, L.; HOROWICZ, R.J. Measurement of refractive nonlinearities in GaAs above bandgap energy. <b>Applied Optics</b>, v. 39, n. 33, p. 6193-6196, 2000. Disponível em: http://repositorio.ipen.br/handle/123456789/7320.
dc.identifier.fasciculo33pt_BR
dc.identifier.issn0003-6935pt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/7320pt_BR
dc.identifier.vol39pt_BR
dc.relation.ispartofApplied Opticspt_BR
dc.rightsopenAccessen
dc.subjectnonlinear opticspt_BR
dc.subjectnonlinear problemspt_BR
dc.subjectsemiconductor materialspt_BR
dc.subjectgallium arsenidespt_BR
dc.subjectcrystalspt_BR
dc.subjectrefractive indexpt_BR
dc.subjectoptical reflectionpt_BR
dc.subjectreflectivitypt_BR
dc.titleMeasurement of refractive nonlinearities in GaAs above bandgap energypt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorLAERCIO GOMES
ipen.codigoautor1190
ipen.contributor.ipenauthorLAERCIO GOMES
ipen.date.recebimento02-12pt_BR
ipen.identifier.ipendoc08414pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication3682a9c8-52ea-4835-9e74-0f623e302d62
relation.isAuthorOfPublication.latestForDiscovery3682a9c8-52ea-4835-9e74-0f623e302d62
sigepi.autor.atividadept_BR
sigepi.autor.atividadeMARTINELLI, M.:-1:-1:Spt_BR
sigepi.autor.atividadeGOMES, L.:1190:-1:Npt_BR
sigepi.autor.atividadeHOROWICZ, R.J.:-1:-1:Npt_BR
sigepi.autor.atividadept_BR

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