In and Cd as defect traps in titanium dioxide

Abstract

We present a study of TiO2 single crystals from the point of view of the dopant atom that simultaneously behaves as the probing element. We used gamma-gamma time dependent perturbed angular correlations working with selected tracer elements (In-111/Cd-111, Cd-111m/Cd-111) together to investigate the different behavior of Cd and In dopants, particularly their interaction with point defects in the TiO2 lattice. Results show that the hyperfine interactions observed at Cd-111 from In-111 or Cd-111m decay are quite different. In-111/Cd-111 results show a single site fraction characterized by a quadrupole frequency with asymmetry parameter similar to those observed for the same probe nuclei in bulk TiO2 oxides. Results for Cd-111m/Cd-111 reveal two site fractions, one characterized by the same hyperfine parameters to those measured in bulk TiO2 and another fraction characterized by a quadrupole frequency and asymmetry parameters with higher values, as observed in thin TiO2 films and correlated with point defects. The results are discussed emphasizing the differences for Cd and In as defect traps on TiO2.