Local crystalline structure of doped semiconductor oxides characterized by perturbed angular correlations

Página do item simplificado
dc.contributor.authorBURIMOVA, ANASTASIApt_BR
dc.contributor.authorCARBONARI, ARTUR W.pt_BR
dc.contributor.authorLIMA, NICOLE P. dept_BR
dc.contributor.authorMIRANDA FILHO, ARNALDO A.pt_BR
dc.contributor.authorSOUZA, ALEXANDRE P. dos S.pt_BR
dc.contributor.authorSALES, TATIANE da S.N.pt_BR
dc.contributor.authorFERREIRA, WANDERSON L.pt_BR
dc.contributor.authorPEREIRA, LUCIANO F.D.pt_BR
dc.contributor.authorCORREA, BRUNO S.pt_BR
dc.contributor.authorSAXENA, RAJENDRA N.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2022-12-02T18:10:02Z
dc.date.available2022-12-02T18:10:02Z
dc.date.issued2022pt_BR
dc.description.abstractDoping semiconductor oxides with trace amounts of non-native elements can improve their properties such as bandgap and conductivity. The lack of local techniques makes the precise characterization of these materials difficult. Among the few techniques capable of providing local characterization, those based on hyperfine interactions at probe nuclei have the advantage of being well established, probing the material homogeneously and completely, thus investigating different regions of material. Some of these techniques are also quite sensitive even at extremely low dopant concentrations. The perturbed angular correlation technique, combined with first-principles calculations, has recently been shown to be a powerful method for characterizing doped semiconductor oxides. In this paper, we present a brief review of the unique information extracted from the semiconductor investigation with such a complex approach, including semiconductor oxides doped with cadmium and other elements. A strong relationship between the local environment, including electronic structure, and the nature of the dopant and the native element of the doped oxides is also shown.pt_BR
dc.description.sponsorshipInstituto de Pesquisas Energéticas e Nucleares (IPEN)pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)pt_BR
dc.description.sponsorshipComissão Nacional de Energia Nuclear (CNEN)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDIPEN: 2020.06.IPEN.43; 2020.06.IPEN.38pt_BR
dc.description.sponsorshipIDFAPESP: 19/15620-0; 17/50332-0; 18/18657-0pt_BR
dc.description.sponsorshipIDCAPES: 88887.661225/2022-00; 88887513796/2020-00pt_BR
dc.description.sponsorshipIDCNEN: 01341.005171/2021-60pt_BR
dc.description.sponsorshipIDCNPq: 140071/2020-2; 142070/2019-0; 303577/2018-5; 307322/2021-1pt_BR
dc.format.extent1-15pt_BR
dc.identifier.citationBURIMOVA, ANASTASIA; CARBONARI, ARTUR W.; LIMA, NICOLE P. de; MIRANDA FILHO, ARNALDO A.; SOUZA, ALEXANDRE P. dos S.; SALES, TATIANE da S.N.; FERREIRA, WANDERSON L.; PEREIRA, LUCIANO F.D.; CORREA, BRUNO S.; SAXENA, RAJENDRA N. Local crystalline structure of doped semiconductor oxides characterized by perturbed angular correlations: experimental and theoretical insights. <b>Crystals</b>, v. 12, n. 9, p. 1-15, 2022. DOI: <a href="https://dx.doi.org/10.3390/cryst12091204">10.3390/cryst12091204</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/33405.
dc.identifier.doi10.3390/cryst12091204pt_BR
dc.identifier.fasciculo9pt_BR
dc.identifier.issn2073-4352pt_BR
dc.identifier.orcid0000-0003-3023-1718pt_BR
dc.identifier.orcid0000-0002-4499-5949pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-4499-5949
dc.identifier.percentilfi53.5pt_BR
dc.identifier.percentilfiCiteScore50pt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/33405
dc.identifier.vol12pt_BR
dc.relation.ispartofCrystalspt_BR
dc.rightsopenAccesspt_BR
dc.subjectcrystal doping
dc.subjectsemiconductor materials
dc.subjectoxides
dc.subjecthyperfine structure
dc.subjectinteractions
dc.subjectperturbed angular correlation
dc.titleLocal crystalline structure of doped semiconductor oxides characterized by perturbed angular correlationspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorNICOLE PEREIRA DE LIMA
ipen.autorARNALDO ALVES MIRANDA FILHO
ipen.autorWANDERSON LOBATO FERREIRA
ipen.autorRAJENDRA NARAIN SAXENA
ipen.autorBRUNO SANTOS CORREA
ipen.autorLUCIANO FABRICIO DIAS PEREIRA
ipen.autorTATIANE DA SILVA NASCIMENTO
ipen.autorALEXANDRE PINHO DOS SANTOS SOUZA
ipen.autorARTUR WILSON CARBONARI
ipen.autorANASTASIA BURIMOVA
ipen.codigoautor14277
ipen.codigoautor15159
ipen.codigoautor14858
ipen.codigoautor1329
ipen.codigoautor15164
ipen.codigoautor3346
ipen.codigoautor9322
ipen.codigoautor15442
ipen.codigoautor1437
ipen.codigoautor14454
ipen.contributor.ipenauthorNICOLE PEREIRA DE LIMA
ipen.contributor.ipenauthorARNALDO ALVES MIRANDA FILHO
ipen.contributor.ipenauthorWANDERSON LOBATO FERREIRA
ipen.contributor.ipenauthorRAJENDRA NARAIN SAXENA
ipen.contributor.ipenauthorBRUNO SANTOS CORREA
ipen.contributor.ipenauthorLUCIANO FABRICIO DIAS PEREIRA
ipen.contributor.ipenauthorTATIANE DA SILVA NASCIMENTO
ipen.contributor.ipenauthorALEXANDRE PINHO DOS SANTOS SOUZA
ipen.contributor.ipenauthorARTUR WILSON CARBONARI
ipen.contributor.ipenauthorANASTASIA BURIMOVA
ipen.date.recebimento22-12
ipen.identifier.fi2.7pt_BR
ipen.identifier.fiCiteScore3.6pt_BR
ipen.identifier.ipendoc29041pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi50.00 - 74.99
ipen.subtituloexperimental and theoretical insightspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication588a3118-cce3-4c6c-8dcc-a1cee1a4a117
relation.isAuthorOfPublication02361e77-4a61-450d-b0be-b5fc3966a7e9
relation.isAuthorOfPublicatione288cd81-18ae-46f1-9784-e2b9e6df5777
relation.isAuthorOfPublicatione8e73f41-f42e-41aa-97a1-c86c5706abe4
relation.isAuthorOfPublication0cfcf140-1709-41ab-ab72-877c86f94225
relation.isAuthorOfPublicationb6252b5c-6acb-4cd0-bd90-b69988090f74
relation.isAuthorOfPublication24b79047-b1bf-4409-a205-0d39870c9cfd
relation.isAuthorOfPublication164c9934-6d0f-430d-a47a-d7b9fdcfbe08
relation.isAuthorOfPublication8f236231-e73c-4182-a596-d83e49cd0404
relation.isAuthorOfPublication4f5e0f7f-3b35-4755-9aa2-7647babb9530
relation.isAuthorOfPublication.latestForDiscovery4f5e0f7f-3b35-4755-9aa2-7647babb9530
sigepi.autor.atividadeSAXENA, RAJENDRA N.:1329:310:Npt_BR
sigepi.autor.atividadeCORREA, BRUNO S.:15164:310:Npt_BR
sigepi.autor.atividadePEREIRA, LUCIANO F.D.:3346:310:Npt_BR
sigepi.autor.atividadeFERREIRA, WANDERSON L.:14858:310:Npt_BR
sigepi.autor.atividadeSALES, TATIANE da S.N.:9322:310:Npt_BR
sigepi.autor.atividadeSOUZA, ALEXANDRE P. dos S.:15442:450:Npt_BR
sigepi.autor.atividadeMIRANDA FILHO, ARNALDO A.:15159:310:Npt_BR
sigepi.autor.atividadeLIMA, NICOLE P. de:14277:310:Npt_BR
sigepi.autor.atividadeCARBONARI, ARTUR W.:1437:310:Npt_BR
sigepi.autor.atividadeBURIMOVA, ANASTASIA:14454:310:Spt_BR
Pacote Original
Agora exibindo 1 - 1 de 1
Imagem de Miniatura
Nome:
29041.pdf
Tamanho:
525.33 KB
Formato:
Adobe Portable Document Format
Descrição:
Baixar
Licença do Pacote
Agora exibindo 1 - 1 de 1
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:
Baixar
Coleções
Periódicos