Current response stability of a commercial PIN photodiode for low dose radiation processing applications
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Radiation Physics and Chemistry
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This work investigates the on-line response of a thin diode, for monitoring low dose radiation processing, with
respect to the linearity between current and dose-rate, the most interesting part being the variation of the current
sensitivity with the accumulated dose. The results obtained indicate that the current response of this diode is
linear and quite stable with repeatability better than 0.2% and a slight decay of 5% of the current sensitivity
(0.28 nA h/Gy) for doses up to 15 kGy. In an attempt to give theoretical support to these results, the radiation
induced current is calculated as a function of the dose rate assuming the diode to be thin as compared with the
standard values of the minority carrier diffusion lengths in intrinsic silicon. Agreement within 2% is found
between calculations and experimental data.
Como referenciar
GONCALVES, JOSEMARY A.C.; MANGIAROTTI, ALESSIO; BUENO, CARMEN C. Current response stability of a commercial PIN photodiode for low dose radiation processing applications. Radiation Physics and Chemistry, v. 167, p. 1-4, 2020. DOI: 10.1016/j.radphyschem.2019.04.026. Disponível em: http://repositorio.ipen.br/handle/123456789/31430. Acesso em: 29 Apr 2026.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.