Development of a new methodology of roughness measurement using optical coherence tomography (OCT) according DIN 4768

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dc.contributor.authorAMARAL, MARCELLO M.pt_BR
dc.contributor.authorRAELE, MARCUS P.pt_BR
dc.contributor.authorSAMAD, RICARDO E.pt_BR
dc.contributor.authorVIEIRA JUNIOR, NILSON D.pt_BR
dc.contributor.authorFREITAS, ANDERSON Z. dept_BR
dc.coverageNacionalpt_BR
dc.creator.eventoENCONTRO NACIONAL DE FISICA DA MATERIA CONDENSADA, 32.pt_BR
dc.date.accessioned2014-11-19T10:36:12Zpt_BR
dc.date.accessioned2014-11-19T14:09:34Zpt_BR
dc.date.accessioned2015-04-01T12:42:46Z
dc.date.available2014-11-19T10:36:12Zpt_BR
dc.date.available2014-11-19T14:09:34Zpt_BR
dc.date.available2015-04-01T12:42:46Z
dc.date.evento11-15 de maio, 2009pt_BR
dc.identifier.citationAMARAL, MARCELLO M.; RAELE, MARCUS P.; SAMAD, RICARDO E.; VIEIRA JUNIOR, NILSON D.; FREITAS, ANDERSON Z. de. Development of a new methodology of roughness measurement using optical coherence tomography (OCT) according DIN 4768. In: ENCONTRO NACIONAL DE FISICA DA MATERIA CONDENSADA, 32., 11-15 de maio, 2009, Aguas de Lindoia, SP. <b>Resumo...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/19329.
dc.identifier.orcidhttps://orcid.org/0000-0002-5018-9126
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.orcidhttps://orcid.org/0000-0002-6461-6766
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/19329pt_BR
dc.local.eventoAguas de Lindoia, SPpt_BR
dc.rightsopenAccesspt_BR
dc.subjectlaser radiationpt_BR
dc.subjecttomographypt_BR
dc.subjectoptical propertiespt_BR
dc.subjectroughnesspt_BR
dc.subjectsurface propertiespt_BR
dc.subjectsample preparationpt_BR
dc.subjectresolutionpt_BR
dc.subjectprogrammingpt_BR
dc.titleDevelopment of a new methodology of roughness measurement using optical coherence tomography (OCT) according DIN 4768pt_BR
dc.typeResumo de eventos científicospt_BR
dspace.entity.typePublication
ipen.autorANDERSON ZANARDI DE FREITAS
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorRICARDO ELGUL SAMAD
ipen.autorMARCUS PAULO RAELE
ipen.autorMARCELLO MAGRI AMARAL
ipen.codigoautor880
ipen.codigoautor1582
ipen.codigoautor909
ipen.codigoautor3272
ipen.codigoautor3443
ipen.contributor.ipenauthorANDERSON ZANARDI DE FREITAS
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.contributor.ipenauthorMARCUS PAULO RAELE
ipen.contributor.ipenauthorMARCELLO MAGRI AMARAL
ipen.date.recebimento09-10pt_BR
ipen.event.datapadronizada2009pt_BR
ipen.identifier.ipendoc14142pt_BR
ipen.notas.internasResumopt_BR
ipen.type.genreResumo
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relation.isAuthorOfPublication.latestForDiscoverye73cdf88-445f-4943-ba23-343560759a3f
sigepi.autor.atividadeAMARAL, MARCELLO M.:3443:-1:Spt_BR
sigepi.autor.atividadeRAELE, MARCUS P.:3272:920:Npt_BR
sigepi.autor.atividadeSAMAD, RICARDO E.:909:930:Npt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, NILSON D.:1582:930:Npt_BR
sigepi.autor.atividadeFREITAS, ANDERSON Z. de:880:920:Npt_BR

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